Jim A. O'Donnell
Jim A. O'Donnell
University of Wisconsin, University of Illinois, Intel
Email verificata su intel.com
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Anno
Signature of superfluid density in the single-particle excitation spectrum of Bi2Sr2CaCu2O8+ δ
DL Feng, DH Lu, KM Shen, C Kim, H Eisaki, A Damascelli, R Yoshizaki, ...
Science 289 (5477), 277-281, 2000
3232000
Magnetoelastic coupling and magnetic anisotropy in films
J O’Donnell, MS Rzchowski, JN Eckstein, I Bozovic
Applied Physics Letters 72 (14), 1775-1777, 1998
1531998
Anisotropic magnetoresistance in tetragonal La1−xCaxMnOδ thin films
JN Eckstein, I Bozovic, J O’Donnell, M Onellion, MS Rzchowski
Applied physics letters 69 (9), 1312-1314, 1996
1451996
Nodal Quasiparticle Lifetime in the Superconducting State of
J Corson, J Orenstein, S Oh, J O'Donnell, JN Eckstein
Physical review letters 85 (12), 2569, 2000
1242000
Magnetoresistance scaling in MBE-grown Mn thin films
J O'donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic
Physical Review B 54 (10), R6841, 1996
1141996
Mesoscopic thermodynamics of an inhomogeneous colossal-magnetoresistive phase
RD Merithew, MB Weissman, FM Hess, P Spradling, ER Nowak, ...
Physical review letters 84 (15), 3442, 2000
1092000
Colossal magnetoresistance magnetic tunnel junctions grown by molecular-beam epitaxy
J O’donnell, AE Andrus, S Oh, EV Colla, JN Eckstein
Applied Physics Letters 76 (14), 1914-1916, 2000
1072000
Low-field magnetoresistance in tetragonal sfilms
J O'Donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic
Physical Review B 55 (9), 5873, 1997
861997
Temperature and magnetic field dependent transport anisotropies in films
J O’Donnell, JN Eckstein, MS Rzchowski
Applied Physics Letters 76 (2), 218-220, 2000
752000
MRAM as embedded non-volatile memory solution for 22FFL FinFET technology
O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ...
2018 IEEE International Electron Devices Meeting (IEDM), 18.1. 1-18.1. 4, 2018
702018
13.3 A 7Mb STT-MRAM in 22FFL FinFET technology with 4ns read sensing time at 0.9 V using write-verify-write scheme and offset-cancellation sensing technique
L Wei, JG Alzate, U Arslan, J Brockman, N Das, K Fischer, T Ghani, ...
2019 IEEE International Solid-State Circuits Conference-(ISSCC), 214-216, 2019
482019
Anisotropic properties of molecular beam epitaxy-grown colossal magnetoresistance manganite thin films
J O’Donnell, M Onellion, MS Rzchowski, I Eckstein, J. N., Bozovic
Journal of Applied Physics 81 (8), 4961-4963, 1997
291997
Characterization of SILC and its end-of-life reliability assessment on 45NM high-K and metal-gate technology
S Pae, T Ghani, M Hattendorf, J Hicks, J Jopling, J Maiz, K Mistry, ...
2009 IEEE International Reliability Physics Symposium, 499-504, 2009
172009
Non-volatile RRAM embedded into 22FFL FinFET technology
O Golonzka, U Arslan, P Bai, M Bohr, O Baykan, Y Chang, A Chaudhari, ...
2019 Symposium on VLSI Technology, T230-T231, 2019
142019
Rheed Studies of a-Axis Oriented DyBa2Cu3O7 Films Grown by All-MBE
I Bozovic, JN Eckstein, N Bozovic, J O'Donnell
MRS Online Proceedings Library Archive 502, 1997
81997
On the similarity of the spectral weight pattern of Bi2Sr2CaCuO8+ δ and La1. 48Nd0. 4Sr0. 12CuO4
DL Feng, DH Lu, KM Shen, S Oh, A Andrus, J O'Donnell, JN Eckstein, ...
Physica C: Superconductivity 341, 2097-2098, 2000
62000
Defect scattering in high Tc and colossal magnetoresistive tunnel junctions
JN Eckstein, J O'Donnell, S Oh, AE Andrus, M Warusawathana, E Bertram, ...
Physica C: Superconductivity 335 (1-4), 184-189, 2000
52000
Mesoscopic Fluctuations in Colossal Magnetoresistance (Frontiers in Magnetism)
RD Merithew, MB Weissman, J O'Donnell
Journal of the Physical Society of Japan 69, 257-261, 2000
32000
eNVM MRAM retention reliability modeling in 22FFL FinFET technology
JA O'Donnell, C Connor, T Pramanik, J Hicks, JG Alzate, F Hamzaoglu, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019
22019
Growth of “colossal” magnetoresistance heterostructures by molecular beam epitaxy
J O’Donnell, AE Andrus, S Oh, E Colla, M Warusawithana, BA Davidson, ...
MRS Online Proceedings Library 602 (1), 9-14, 1999
21999
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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