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- Andreas F. MolischProfessor of Electrical Engineering, University of Southern CaliforniaEmail verificata su usc.edu
- Boon Loong NgSamsung Research AmericaEmail verificata su samsung.com
- Hao ChenSamsung Research AmericaEmail verificata su samsung.com
- Joonyoung ChoSamsung Research AmericaEmail verificata su samsung.com
- Jeongho JeonSamsung Research America, MV, CAEmail verificata su samsung.com
- Shengqian HanBeihang University (BUAA)Email verificata su buaa.edu.cn
- Zheda LiAmazon Lab126Email verificata su usc.edu
- Linsheng LiHuawei FinlandEmail verificata su huawei.com
- Katsuyuki HanedaAssociate Professor, Department of Electronics and Nanoengineering, Aalto UniversityEmail verificata su aalto.fi
- Peshal NayakEngineer, Technology StandardizationEmail verificata su samsung.com
- Jianzhong (Charlie) ZhangSamsungEmail verificata su samsung.com
- Russell D FordSamsung Research AmericaEmail verificata su nyu.edu
- Jianhua Mo (莫建华)Samsung Research America, Plano, TexasEmail verificata su samsung.com
- Ahmad A. I. IbrahimAppleEmail verificata su apple.com
- Ahmad AlAmmouriSamsung Research AmericaEmail verificata su utexas.edu
- Hatim BehairyEmail verificata su gmualumni.org
- Faisal AlawwadKACSTEmail verificata su kacst.edu.sa
- Ozgun Y. BursaliogluDocomo InnovationsEmail verificata su docomoinnovations.com
- Young-Jin KimSamsung ElectronicsEmail verificata su samsung.com
- Soonyoung LeeLG AI ResearchEmail verificata su lgresearch.ai