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- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Enxia ZhangUniversity of Central FloridaEmail verificata su ucf.edu
- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Robert A ReedVanderbilt UniversityEmail verificata su vanderbilt.edu
- Dimitri LintenImecEmail verificata su imec.be
- Rong JiangVanderbilt UniversityEmail verificata su vanderbilt.edu
- Pan WangVanderbilt University;Email verificata su vanderbilt.edu
- Michael AllesVanderbilt UniversityEmail verificata su vanderbilt.edu
- Chundong LiangVanderbilt University; Maxim Integrated; Micron; Amazon AWSEmail verificata su amazon.com
- Andrew O'HaraWestern Michigan UniversityEmail verificata su wmich.edu
- Wenjun LiaoMicrosoftEmail verificata su microsoft.com
- Alexander A. BalandinDistinguished Professor of Materials Science and Engineering, UCLAEmail verificata su seas.ucla.edu