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- Qing QuAssistant Professor, Dept. of EECS, University of MichiganEmail verificata su umich.edu
- Zhihui ZhuAssistant Professor, Ohio State UniversityEmail verificata su osu.edu
- Chong YouGoogleEmail verificata su google.com
- Jinxin ZhouOhio State UniversityEmail verificata su osu.edu
- Tianyu Ding, Ph.D.Senior Researcher, Microsoft | Johns Hopkins UniversityEmail verificata su microsoft.com
- Sheng LiuStanford UniversityEmail verificata su stanford.edu
- Yuexiang ZhaiUC BerkeleyEmail verificata su berkeley.edu
- Jeremias SulamAssistant Professor, BME, Johns Hopkins UniversityEmail verificata su jhu.edu
- Carlos Fernandez-GrandaCourant Institute and Center for Data Science, New York UniversityEmail verificata su cims.nyu.edu
- Kangning LiuNew York UniversityEmail verificata su nyu.edu
- Tingting WuImaging Scientist at MetalenzEmail verificata su wustl.edu
- Matthew D. LewAssociate Professor of Electrical and Systems Engineering, Washington University in St. LouisEmail verificata su wustl.edu
- Can YarasPhD Student, University of MichiganEmail verificata su umich.edu
- PENG WANGPostdoc Fellow, Department of Electrical Engineering and Computer Science, University of MichiganEmail verificata su umich.edu
- Wei HuAssistant Professor of Computer Science and Engineering, University of MichiganEmail verificata su umich.edu
- Yutong WangPostdoctoral Research Fellow, University of MichiganEmail verificata su umich.edu
- Yen-Chang HsuSamsung Research AmericaEmail verificata su gatech.edu
- Yilin ShenAI Research ScientistEmail verificata su samsung.com
- Ting HuaSamsung Research AmericaEmail verificata su vt.edu
- Shangqian GaoUniversity of Pittsburgh; Samsung Research AmericaEmail verificata su pitt.edu