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- Youngchul SungProfessor, Electrical Engineering, KAISTEmail verificata su ee.kaist.ac.kr
- Md Saifur RahmanSamsung Research America - DallasEmail verificata su samsung.com
- Jeongho JeonSamsung Research America, MV, CAEmail verificata su samsung.com
- Donggun KimSamsung ElectronicsEmail verificata su kaist.ac.kr
- Brian L. EvansEngineering Foundation Professor, ECE, WNCG, University of Texas at AustinEmail verificata su ece.utexas.edu
- Jinseok ChoiKorea Advanced Institute of Science and Technology (KAIST)Email verificata su kaist.ac.kr
- Masahiro YukawaKeio UniversityEmail verificata su elec.keio.ac.jp
- Juho ParkETRIEmail verificata su etri.re.kr
- Ahmad A. I. IbrahimAppleEmail verificata su apple.com
- Marios KountourisProfessor, EURECOM, FranceEmail verificata su eurecom.fr
- Younsun KimSamsungEmail verificata su samsung.com
- Gary XuSamsung Research AmericaEmail verificata su samsung.com
- Jin YuanSamsung Research America - DallasEmail verificata su samsung.com
- Jianzhong (Charlie) ZhangSamsungEmail verificata su samsung.com
- Heejung YuDept. of Electronics and Information Eng., Korea UniversityEmail verificata su korea.ac.kr
- Junse LeeUT Austin, Samsung Electronics, KAISTEmail verificata su utexas.edu
- Song NohIncheon National UniversityEmail verificata su inu.ac.kr
- Dalin ZhuSamsung Research America, Inc.Email verificata su utexas.edu
- Ahmed AlkhateebAssistant Professor, Arizona State UniversityEmail verificata su asu.edu
- Alan GathererCirrus360Email verificata su ieee.org