Titolo
Citata da
Citata da
Anno
A comparison of the SEU response of planar and FinFET D flip-flops at advanced technology nodes
P Nsengiyumva, DR Ball, JS Kauppila, N Tam, M McCurdy, WT Holman, ...
IEEE Transactions on Nuclear Science 63 (1), 266-272, 2016
482016
Analysis of bulk FinFET structural effects on single-event cross sections
P Nsengiyumva, LW Massengill, ML Alles, BL Bhuva, DR Ball, ...
IEEE Transactions on Nuclear Science 64 (1), 441-448, 2016
232016
Exploiting parallelism and heterogeneity in a radiation effects test vehicle for efficient single-event characterization of nanoscale circuits
JS Kauppila, JA Maharrey, RC Harrington, TD Haeffner, P Nsengiyumva, ...
IEEE Transactions on Nuclear Science 65 (1), 486-494, 2017
142017
Impact of single-event transient duration and electrical delay at reduced supply voltages on set mitigation techniques
JA Maharrey, JS Kauppila, RC Harrington, P Nsengiyumva, DR Ball, ...
IEEE Transactions on Nuclear Science 65 (1), 362-368, 2017
122017
The impact of charge collection volume and parasitic capacitance on SEUs in SOI-and bulk-FINFET D flip-flops
DR Ball, ML Alles, JS Kauppila, RC Harrington, JA Maharrey, ...
IEEE Transactions on Nuclear Science 65 (1), 326-330, 2017
112017
Angular effects on single-event mechanisms in bulk FinFET technologies
P Nsengiyumva, LW Massengill, JS Kauppila, JA Maharrey, ...
IEEE Transactions on Nuclear Science 65 (1), 223-230, 2017
112017
Effect of transistor variants on single-event transients at the 14-/16-nm bulk FinFET technology generation
RC Harrington, JA Maharrey, JS Kauppila, P Nsengiyumva, DR Ball, ...
IEEE Transactions on Nuclear Science 65 (8), 1807-1813, 2018
42018
Characterization of the CMOS FinFET Structure on Single-event Effects: Basic Charge Collection Mechanisms and Soft Error Modes
P Nsengiyumva
Vanderbilt University, 2018
42018
Dual-interlocked logic for single-event transient mitigation
JA Maharrey, JS Kauppila, RC Harrington, P Nsengiyumva, DR Ball, ...
IEEE Transactions on Nuclear Science 65 (8), 1872-1878, 2017
42017
Empirical modeling of FinFET SEU cross sections across supply voltage
RC Harrington, JS Kauppila, JA Maharrey, TD Haeffner, AL Sternberg, ...
IEEE Transactions on Nuclear Science 66 (7), 1427-1432, 2019
22019
Investigating power characteristics of memristor-based logic gates and their applications in a security primitive
J Dofe, J Frey, P Nsengiyumva, Q Yu
2015 IEEE 58th International Midwest Symposium on Circuits and Systems …, 2015
22015
Single-event upset responses of dual-and triple-well designs at advanced planar and FinFET technologies
H Zhang, H Jiang, TR Assis, DR Ball, I Chatterjee, B Narasimham, ...
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
12016
Investigation of single-event upsets in dynamic logic based flip-flops
P Nsengiyumva, Q Yu
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 818-821, 2015
12015
Exploiting SEU Data Analysis to Extract Fast SET Pulses
RC Harrington, JS Kauppila, JA Maharrey, TD Haeffner, EX Zhang, ...
IEEE Transactions on Nuclear Science 66 (6), 932-937, 2019
2019
Spatial and Temporal Considerations for Analysis of Single-Event Mechanisms in FinFET Technologies
P Nsengiyumva, LW Massengill, ML Alles, DR Ball, JS Kauppila, ...
Vanderbilt University Nashville United States, 2017
2017
Investigating the effects of single-event upsets in static and dynamic registers
P Nsengiyumva
2014
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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