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- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Yevgeniy PuzyrevData & Applied Scientist, MicrosoftEmail verificata su microsoft.com
- David R HughartSandia National LaboratoriesEmail verificata su sandia.gov
- Chris G. Van de WalleProfessor of Materials, University of California, Santa BarbaraEmail verificata su mrl.ucsb.edu
- Xiao ShenAssociate Professor of Physics, University of MemphisEmail verificata su memphis.edu
- Matthew BeckChemical and Materials Engineering, University of KentuckyEmail verificata su engr.uky.edu
- Tania RoyDuke UniversityEmail verificata su duke.edu
- Chunguang TangANUEmail verificata su anu.edu.au
- Leonard FeldmanProfessor of Physics and Materials ScienceEmail verificata su rutgers.edu
- Joseph W. LydingProfessor of Electrical and Computer Engineering, University of IllinoisEmail verificata su illinois.edu
- AG MarinopoulosResearch Associate, Center of Physics, University of CoimbraEmail verificata su uc.pt
- Arthur H EdwardsSenior Research Physicist, Air Force Research LaboratoryEmail verificata su spaceforce.mil
- Aldo Di CarloProf. of Opto&Nano-electronics, University of Rome Tor Vergata. Consiglio Nazionale delle RicercheEmail verificata su uniroma2.it
- Roy MeadeAyar LabsEmail verificata su ayarlabs.com
- Vijay KumarDr. Vijay Kumar Foundation and Shiv Nadar UniversityEmail verificata su snu.edu.in
- Kalman VargaVanderbilt UniversityEmail verificata su vanderbilt.edu
- Heejo LeeProfessor of Computer Science, Korea UniversityEmail verificata su korea.ac.kr