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Gilles Poullain
Gilles Poullain
Lab. CRISMAT Université de Caen-Normandie/ENSICAEN/CNRS
Email verificata su ensicaen.fr
Titolo
Citata da
Citata da
Anno
Orientation control of textured PZT thin films sputtered on silicon substrate with TiOx seeding
R Bouregba, G Poullain, B Vilquin, H Murray
Materials research bulletin 35 (9), 1381-1390, 2000
972000
Asymmetrical leakage currents as a possible origin of the polarization offsets observed in compositionally graded ferroelectric films
R Bouregba, G Poullain, B Vilquin, G Le Rhun
Journal of applied physics 93 (9), 5583-5591, 2003
542003
Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (1 1 1)-oriented PLZT 10/40/60 thin films
A Ferri, S Saitzek, A Da Costa, R Desfeux, G Leclerc, R Bouregba, ...
Surface Science 602 (11), 1987-1992, 2008
422008
Effect of in situ Pt bottom electrode deposition and of Pt top electrode preparation on PZT thin films properties
B Vilquin, G Le Rhun, R Bouregba, G Poullain, H Murray
Applied surface science 195 (1-4), 63-73, 2002
402002
a-Axis oriented superconductive YBCO thin films: growth mechanism on MgO substrate
JF Hamet, B Mercey, M Hervieu, G Poullain, B Raveau
Physica C: Superconductivity 198 (3-4), 293-302, 1992
401992
Graded ferroelectric thin films: Possible origin of the shift along the polarization axis
G Poullain, R Bouregba, B Vilquin, G Le Rhun, H Murray
Applied physics letters 81 (26), 5015-5017, 2002
382002
A model for fatigue in ferroelectric thin films based on trapping of carriers at interfacial states
G Le Rhun, G Poullain, R Bouregba
Journal of applied physics 96 (7), 3876-3882, 2004
372004
Investigation of thickness dependence of the ferroelectric properties of Pb (Zr0. 6Ti0. 4) O3 thin-film capacitors
R Bouregba, G Le Rhun, G Poullain, G Leclerc
Journal of applied physics 99 (3), 2006
352006
Polarization loop deformations of an oxygen deficient Pb (Zr0. 25, Ti0. 75) O3 ferroelectric thin film
G Le Rhun, R Bouregba, G Poullain
Journal of Applied Physics 96 (10), 5712-5721, 2004
342004
Numerical extraction of the true ferroelectric polarization due to switching domains from hysteresis loops measured using a Sawyer-Tower circuit
R Bouregba, G Poullain
Ferroelectrics 274 (1), 165-181, 2002
322002
Correlation between local hysteresis and crystallite orientation in PZT thin films deposited on Si and MgO substrates
R Desfeux, C Legrand, A Da Costa, D Chateigner, R Bouregba, ...
Surface science 600 (1), 219-228, 2006
302006
Elaboration of (1 1 1)-oriented La-doped PZT thin films on platinized silicon substrates
G Leclerc, B Domenges, G Poullain, R Bouregba
Applied Surface Science 253 (3), 1143-1149, 2006
292006
Sawyer–Tower hysteresis measurements on micron sized capacitors
R Bouregba, B Vilquin, G Le Rhun, G Poullain, B Domenges
Review of Scientific Instruments 74 (10), 4429-4435, 2003
282003
Fatigue properties of oriented PZT ferroelectric thin films
G Le Rhun, G Poullain, R Bouregba, G Leclerc
Journal of the European Ceramic Society 25 (12), 2281-2284, 2005
272005
Orientation control of rhomboedral PZT thin films on Pt/Ti/SiO2/Si substrates
B Vilquin, R Bouregba, G Poullain, M Hervieu, H Murray
The European Physical Journal-Applied Physics 15 (3), 153-165, 2001
262001
Epitaxial PZT thin films on TiOx covered Pt/MgO substrate by RF magnetron sputtering
R Bouregba, G Poullain, B Vilquin, H Murray
Ferroelectrics 256 (1), 47-68, 2001
262001
Computation of the polarization due to the ferroelectric layer in a stacked capacitor from Sawyer–Tower hysteresis measurements
R Bouregba, G Poullain
Journal of applied physics 93 (1), 522-532, 2003
232003
Redox Mechanisms and Density of Holes by XAS in the Compensated Series Bi2-xPbxSr2Ca1-xYxCu2O8+ δ (0≤ x≤ 1)
N Merrien, F Studer, G Poullain, C Michel, AM Flank, P Lagarde, ...
Journal of Solid State Chemistry 105 (1), 112-129, 1993
231993
Conductance of silicon grain boundaries in as‐grown and annealed bicrystals
G Poullain, B Mercey, G Nouet
Journal of applied physics 61 (4), 1547-1552, 1987
231987
Interface depolarization field as common denominator of fatigue and size effect in Pb (Zr0. 54Ti0. 46) O3 ferroelectric thin film capacitors
R Bouregba, N Sama, C Soyer, G Poullain, D Remiens
Journal of Applied Physics 107 (10), 2010
222010
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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