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- G J ShifletProfessor of Materials Science, University of VirginiaEmail verificata su virginia.edu
- Terry TrittProfessor of Physics, Clemson UniversityEmail verificata su g.clemson.edu
- William L. JohnsonCalifornia Institute of TechnologyEmail verificata su caltech.edu
- Takeshi EgamiProfessor of Materials Science and Physics, University of TennesseeEmail verificata su utk.edu
- Jack SimonsonFarmingdale State CollegeEmail verificata su farmingdale.edu
- Wenjie XieTechnische Universität DarmstadtEmail verificata su mr.tu-darmstadt.de
- SA WolfUniversity of VirginiaEmail verificata su virginia.edu
- Despina LoucaProfessor of Physics, University of VirginiaEmail verificata su virginia.edu
- Jian HeClemson UniversityEmail verificata su clemson.edu
- Mircea R. StanVirginia Microelectronics Consortium (VMEC) Professor, University of VirginiaEmail verificata su virginia.edu
- J GopalakrishnanSolid State and structural Chemistry Unit, Indian Institute of Science, Bangalore, IndiaEmail verificata su iisc.ac.in
- Di WuShaanxi Normal University/Southern University of Science and Technology/University of VirginiaEmail verificata su snnu.edu.cn
- Eugene ChenSamsung, Grandis, Cypress Semiconductor, Motorola, NVEEmail verificata su samsung.com
- Xinfeng Tang (唐新峰)Wuhan University of TechnologyEmail verificata su whut.edu.cn
- Dmytro ApalkovSr. Principal Engineer/Sr. Director, Modeling, Samsung Semiconductor R&DEmail verificata su samsung.com
- anke weidenkaffTU DarmstadtEmail verificata su mr.tu-darmstadt.de
- Rama VenkatasubramanianJohns Hopkins University Applied Physics LabEmail verificata su jhuapl.edu
- Jiwei LuAFOSR