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- John Q. XiaoProfessor of Department of Physics and Astronomy, University of DelawareEmail verificata su udel.edu
- Yunpeng ChenWestern DigitalEmail verificata su udel.edu
- Weigang WangUniversity of ArizonaEmail verificata su physics.arizona.edu
- Jun WuPh.D. of Physics, Spectrum Magnetics LLCEmail verificata su udel.edu
- Xiaoming Kou3MEmail verificata su mmm.com
- Chaoying NiProfessor of Materials Science and Engineering, University of DelawareEmail verificata su udel.edu
- Tao WangHuazhong University of Science and TechnologyEmail verificata su hust.edu.cn
- Halise CelikGraduate student at Physics, university of DelawareEmail verificata su udel.edu
- Takahiro MoriyamaNagoya UniversityEmail verificata su mp.pse.nagoya-u.ac.jp
- Qi LuChemical Engineering, Tsinghua UniversityEmail verificata su tsinghua.edu.cn
- Yunsong XieSamsung Austin SemiconductorEmail verificata su samsung.com
- C. L. ChienDepartment of Physics and Astronomy, Johns Hopkins UniversityEmail verificata su jhu.edu
- Michael HarderBritish Columbia Institute of TechnologyEmail verificata su bcit.ca
- Bai LihuiShandong UniversityEmail verificata su sdu.edu.cn
- James KolodzeyUniversity of DelawareEmail verificata su udel.edu
- Chong BiStanford UniversityEmail verificata su stanford.edu
- Barry ZinkProfessor of Physics, University of DenverEmail verificata su du.edu
- Matthew JerryUniversity of Notre Dame / Pennsylvania State UniversityEmail verificata su nd.edu
- T. J. SilvaNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Tingyong ChenArizona State UniversityEmail verificata su asu.edu