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Bijaya Paudyal
Bijaya Paudyal
Enel Green Power North America
Verified email at enel.com - Homepage
Title
Cited by
Cited by
Year
Temperature dependent carrier lifetime studies on Ti-doped multicrystalline silicon
BB Paudyal, KR McIntosh, DH Macdonald
Journal of Applied Physics 105 (12), 2009
452009
Generalized procedure to determine the dependence of steady-state photoconductance lifetime on the occupation of multiple defects
KR McIntosh, BB Paudyal, DH Macdonald
Journal of Applied Physics 104 (8), 2008
342008
Temperature dependent carrier lifetime studies of Mo in crystalline silicon
BB Paudyal, KR McIntosh, DH Macdonald, G Coletti
Journal of Applied Physics 107 (5), 2010
292010
The implementation of temperature control to an inductive‐coil photoconductance instrument for the range of 0–230° C
BB Paudyal, KR McIntosh, DH Macdonald, BS Richards, RA Sinton
Progress in Photovoltaics: Research and Applications 16 (7), 609-613, 2008
242008
Temperature dependent electron and hole capture cross sections of iron-contaminated boron-doped silicon
BB Paudyal, KR McIntosh, DH Macdonald
2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 001588-001593, 2009
232009
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon
Y Yoon, B Paudyal, J Kim, YW Ok, P Kulshreshtha, S Johnston, ...
Journal of Applied Physics 111 (3), 2012
132012
Measured and calculated DC arc-flash incident energy in a large-scale photovoltaic plant
B Paudyal, M Bolen, T Short, J Woodard
IEEE Journal of Photovoltaics 9 (5), 1343-1349, 2019
72019
PV plant performance loss rate assessment: Significance of data filtering and aggregation
B Paudyal, M Bolen, D Fregosi
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 0866-0869, 2019
72019
Analysis of PV module power loss and cell crack effects due to accelerated aging tests and field exposure
C Libby, B Paudyal, X Chen, WB Hobbs, D Fregosi, A Jain
IEEE Journal of Photovoltaics 13 (1), 165-173, 2022
42022
Si-SiO2 interface characterisation from exposure to an accelerated humidity environment
LP Johnson, KR McIntosh, BS Richards, H Jin, B Paudyal, E Klampaftis
Proc. 44th ANZSES conference, 2006
42006
Measurement of DC arc-flash incident energy in large-scale photovoltaic plants: A basis for standardization
B Paudyal, M Bolen, TA Short, JM Woodard
IEEE Transactions on Industry Applications 56 (6), 6033-6040, 2020
32020
Analysis of Variability in Calculated Performance Loss Rates of Large-Scale PV Plants
D Fregosi, M Bolen, B Paudyal
2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 1742-1748, 2020
32020
Identification of metal impurities in crystalline silicon wafers
B Paudyal, YH Yoon, D Cornwell, P Shaw, F Machuca
2012 38th IEEE Photovoltaic Specialists Conference, 000437-000441, 2012
32012
Temperature and injection dependent lifetime spectroscopy for defect characterization in silicon
BB Paudyal
The Australian National University, 2010
32010
TEMPERATURE DEPENDENT ELECTRON AND HOLE CAPTURE CROSS SECTIONS OF THE MOLYBDENUM IN SILICON
BB Paudyal, KR McIntosh, DH Macdonald, G Coletti
24th European Photovoltaic Solar Energy Conference (EU PVSEC) and Exhibition, 2009
3*2009
An Assessment of In-Field Irradiance Sensor Accuracy and Error Mitigation Techniques
D Fregosi, M Bolen, B Paudyal
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 1430-1436, 2021
22021
Introduction of negative charges in nitride for PV applications
H Jin, KJ Weber, BB Paudyal, C Zhang
2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 000017-000021, 2009
22009
Characterisation of the Si-SiO2 interface after humidity exposure
LP Johnson, KR McIntosh, BS Richards, H Jin, B Paudyal, E Klampaftis
Australia and New Zealand Solar Energy Society Conference, 2006
22006
Significance of Power and Energy Ratings of Modules in Large-scale PV Plants
B Paudyal, DC Paniagua
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), 1271-1274, 2022
12022
Measured dc Arc-flash Risk in a Photovoltaic System
B Paudyal, M Bolen, T Short, J Woodard
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 3140-3143, 2019
12019
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