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A. Rodriguez-Fernández
A. Rodriguez-Fernández
Universidad Autónoma de Barcelona
Email verificata su getalma.eu - Home page
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Citata da
Citata da
Anno
A 3D kinetic Monte Carlo simulation study of resistive switching processes in Ni/HfO2/Si-n+-based RRAMs
S Aldana, P García-Fernández, A Rodríguez-Fernández, R Romero-Zaliz, ...
Journal of Physics D: Applied Physics 50 (33), 335103, 2017
712017
Resistive Switching with Self-Rectifying Tunability and Influence of the Oxide Layer Thickness in Ni/HfO2/n+-Si RRAM Devices
A Rodriguez-Fernandez, S Aldana, F Campabadal, J Sune, E Miranda, ...
IEEE Transactions on Electron Devices 64 (8), 3159-3166, 2017
352017
Characterization of HfO2-based devices with indication of second order memristor effects
A Rodriguez-Fernandez, C Cagli, L Perniola, E Miranda, J Suñé
Microelectronic Engineering 195, 101-106, 2018
302018
Switching Voltage and Time Statistics of Filamentary Conductive Paths in HfO2-Based ReRAM Devices
A Rodriguez-Fernandez, C Cagli, J Suñé, E Miranda
IEEE Electron Device Letters 39 (5), 656-659, 2018
282018
Temperature and polarity dependence of the switching behavior of Ni/HfO2-based RRAM devices
A Rodriguez, MB Gonzalez, E Miranda, F Campabadal, J Suñe
Microelectronic Engineering 147, 75-78, 2015
202015
Effect of the voltage ramp rate on the set and reset voltages of ReRAM devices
A Rodriguez-Fernandez, C Cagli, L Perniola, J Suñé, E Miranda
Microelectronic Engineering 178, 61-65, 2017
192017
Study on the connection between the set transient in RRAMs and the progressive breakdown of thin oxides
FL Aguirre, A Rodriguez-Fernandez, SM Pazos, J Suñé, E Miranda, ...
IEEE Transactions on Electron Devices 66 (8), 3349-3355, 2019
162019
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis
A Rodriguez-Fernandez, C Cagli, L Perniola, J Suñé, E Miranda
Microelectronics Reliability 76, 178-183, 2017
122017
Waveform and frequency effects on reset transition in bipolar ReRAM in flux-charge space
MM Al Chawa, A Rodriguez-Fernandez, M Bargallo, F Campabadal, ...
International Conference on Memristive Materials, Devices & Systems …, 2017
112017
Urtigal, the Galician group of interest in urticaria. Efficacy and safety of up-dosing antihistamines in chronic spontaneous urticaria: A systematic review of the literature
P Iriarte Sotes, M Armisén, T Usero-Bárcena, A Rodriguez Fernandez, ...
J. Investig. Allergol. Clin. Immunol 31, 282-291, 2021
72021
SPICE model for the ramp rate effect in the reset characteristic of memristive devices
A Rodriguez-Fernandez, J Suñé, E Miranda, MB Gonzalez, ...
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-4, 2017
72017
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
A Rodriguez-Fernandez, J Muñoz-Gorriz, J Suñé, E Miranda
Microelectronics reliability 88, 142-146, 2018
62018
SPICE simulation of 1T1R structures based on a logistic hysteresis operator
GA Patterson, A Rodriguez-Fernandez, J Suñé, E Miranda, C Cagli, ...
2017 Spanish Conference on Electron Devices (CDE), 1-4, 2017
52017
Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates
A Rodríguez, MB Gonzalez, F Campabadal, J Suñé, E Miranda
Microelectronics Reliability 55 (9-10), 1442-1445, 2015
52015
Effect of prevailing winds and land use on Alternaria airborne spore load
A Rodríguez-Fernández, C Blanco-Alegre, AM Vega-Maray, ...
Journal of Environmental Management 332, 117414, 2023
42023
How to select the optimal monitoring locations for an aerobiological network: a case of study in central northwest of Spain
A Rodríguez-Fernández, J Oteros, AM Vega-Maray, RM Valencia-Barrera, ...
Science of The Total Environment 827, 154370, 2022
42022
Breakdown time statistics of successive failure events in constant voltage-stressed Al2O3/HfO2 nanolaminates
A Rodriguez, MB Gonzalez, F Campabadal, J Suñé, E Miranda
Microelectronic Engineering 147, 85-88, 2015
42015
On the properties of conducting filament in ReRAM
X Lian, M Lanza, A Rodríguez, E Miranda, J Suñé
2014 12th IEEE International Conference on Solid-State and Integrated …, 2014
42014
Function-fit model for the rate of conducting filament generation in constant voltage-stressed multilayer oxide stacks
A Rodriguez-Fernandez, J Suñé, E Miranda, MB González, ...
Journal of Vacuum Science & Technology B 35 (1), 2017
32017
Analysis and modeling of filamentary conduction in Hf0₂-based structures
A Rodríguez Fernández
12018
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20