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- Ge WangRensselaer Polytechnic InstituteEmail verificata su rpi.edu
- James D. SchiffbauerAssociate Professor, Mizzou; Director, X-ray Microanalysis LaboratoryEmail verificata su missouri.edu
- Hengyong YuIEEE Fellow, University of Massachusetts LowellEmail verificata su uml.edu
- Shuhai XiaoVirginia TechEmail verificata su vt.edu
- Eric A. HoffmanProfessor of Radiology, University of IowaEmail verificata su uiowa.edu
- Dr. Dragoş M. VasilescuParker B. Francis Fellow, University of British ColumbiaEmail verificata su hli.ubc.ca
- Doug A. BowmanProfessor of Computer Science, Virginia TechEmail verificata su vt.edu
- Masoud AgahVirginia TechEmail verificata su vt.edu
- Shree NarayananProcess Engineer, IntelEmail verificata su vt.edu
- Samit AriProfessor, Dept. of Electronics & Communication Engineering, NIT RourkelaEmail verificata su nitrkl.ac.in
- Goutam SahaProfessor, Dept. of Electronics & ECE,IIT KharagpurEmail verificata su ece.iitkgp.ac.in
- Hao Gong, PhDMayo Clinic, Associate Consultant, and Assistant Professor of RadiologyEmail verificata su mayo.edu
- Omid GhasemalizadehApplied Science ManagerEmail verificata su vt.edu
- Hewei GaoTsinghua UniversityEmail verificata su tsinghua.edu.cn
- Jesse BroceTowson UniversityEmail verificata su towson.edu
- Abhijit A. GurjarpadhyeVistex, IncEmail verificata su vt.edu
- Bryce WhitedVirginia TechEmail verificata su vt.edu
- Edward FoxProfessor of Computer Science, Virginia Tech, VPI&SUEmail verificata su vt.edu
- Chris WyattAssociate Professor of Electrical and Computer Engineering, Virginia TechEmail verificata su vt.edu
- Sourav MishraUniversity of TokyoEmail verificata su cvm.t.u-tokyo.ac.jp