| MRAM as embedded non-volatile memory solution for 22FFL FinFET technology O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... 2018 IEEE International Electron Devices Meeting (IEDM), 18.1. 1-18.1. 4, 2018 | 146 | 2018 |
| 13.2 A 3.6Mb 10.1Mb/mm2 Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V … P Jain, U Arslan, M Sekhar, BC Lin, L Wei, T Sahu, J Alzate-Vinasco, ... 2019 IEEE International Solid-State Circuits Conference-(ISSCC), 212-214, 2019 | 135 | 2019 |
| 13.3 a 7mb stt-mram in 22ffl finfet technology with 4ns read sensing time at 0.9 v using write-verify-write scheme and offset-cancellation sensing technique L Wei, JG Alzate, U Arslan, J Brockman, N Das, K Fischer, T Ghani, ... 2019 IEEE International Solid-State Circuits Conference-(ISSCC), 214-216, 2019 | 131 | 2019 |
| 2 MB array-level demonstration of STT-MRAM process and performance towards L4 cache applications JG Alzate, U Arslan, P Bai, J Brockman, YJ Chen, N Das, K Fischer, ... 2019 IEEE International Electron Devices Meeting (IEDM), 2.4. 1-2.4. 4, 2019 | 100 | 2019 |
| Non-volatile RRAM embedded into 22FFL FinFET technology O Golonzka, U Arslan, P Bai, M Bohr, O Baykan, Y Chang, A Chaudhari, ... 2019 Symposium on VLSI Technology, T230-T231, 2019 | 65 | 2019 |
| IEEE Int. Electron Devices Meet O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... the press); https://ieee-iedm. org/program, 2018 | 6 | 2018 |
| A Quantitative Safety Assessment Methodology for Safety-Critical Programmable Electronic Systems Using Fault Injection MA Reynolds, CR Elks, N George, M Sekhar, T DeLong, BW Johnson SAE International Journal of Passenger Cars-Electronic and Electrical …, 2009 | 4 | 2009 |
| Pre-Fault Injection Analyses for Efficient Fault Injection M Sekhar University of Virginia, 2008 | 1 | 2008 |
