| The effect of vacancies on the microwave surface resistance of niobium revealed by positron annihilation spectroscopy A Romanenko, CJ Edwardson, PG Coleman, PJ Simpson Applied Physics Letters 102 (23), 2013 | 37 | 2013 |
| Positron annihilation studies of the AlOx/SiO2/Si interface in solar cell structures CJ Edwardson, PG Coleman, TTA Li, A Cuevas, S Ruffell Journal of Applied Physics 111 (5), 2012 | 16 | 2012 |
| The evolution of vacancy-type defects in silicon-on-insulator structures studied by positron annihilation spectroscopy PG Coleman, D Nash, CJ Edwardson, AP Knights, RM Gwilliam Journal of Applied Physics 110 (1), 2011 | 8 | 2011 |
| Positron annihilation studies of fluorine-vacancy complexes in phosphorus-and fluorine-implanted germanium CJ Edwardson, PG Coleman, HAW El Mubarek Semiconductor Science and Technology 29 (3), 035005, 2014 | 7 | 2014 |
| Vacancy-type defects created by single-shot and chain ion implantation of silicon PG Coleman, CJ Edwardson, AP Knights, RM Gwilliam New Journal of Physics 14 (2), 025007, 2012 | 7 | 2012 |
| Positron and positronium studies of silica aerogel CJ Edwardson, MDW Grogan, TA Birks, PG Coleman Journal of Physics: Conference Series 262 (1), 012018, 2011 | 6 | 2011 |
| Positron annihilation studies of fluorine-vacancy complexes in Si and SiGe CJ Edwardson, PG Coleman, HAW El Mubarek, AS Gandy Journal of Applied Physics 111 (7), 2012 | 4 | 2012 |
| Direct observation of electron capture and reemission by the divacancy via charge transient positron spectroscopy CJ Edwardson, PG Coleman, DJ Paez, JK Doylend, AP Knights Physical Review Letters 110 (13), 136401, 2013 | 3 | 2013 |
| Inner workings of the 120C baking effect studied by positron annihilation A Romanenko, C Edwardson, P Coleman Talk at TFSRF, 2012 | 3 | 2012 |
| Positron Studies of Defects in Thin Films and Semiconductors CJ Edwardson University of Bath, 2013 | 2 | 2013 |
| Defects in TiO2 films on p+-Si studied by positron annihilation spectroscopy PG Coleman, CJ Edwardson, A Zhang, X Ma, X Pi, D Yang Materials Science and Engineering: B 177 (8), 625-628, 2012 | 1 | 2012 |
| Positron annihilation studies of the AlOₓ/SiO₂/Si interface in solar cell structures CJ Edwardson, PG Coleman, TTA Li, A Cuevas, S Ruffell American Institute of Physics (AIP), 2012 | | 2012 |
| Yang, D.(2012) Defects in TiO 2 films on p+-Si studied by positron annihilation spectroscopy. Materials Science & Engineering B-Solid State Materials for Advanced Technology … PG Coleman, CJ Edwardson, A Zhang, X Ma, X Pi | | |
| Slow positron beams-A unique and powerful tool in the development of advanced silicon devices AP Knights, JK Doylend, JDB Bradley, JJ Ackert, DF Logan, KJ Murray, ... | | |
