Jean-Max Dutertre
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When clocks fail: On critical paths and clock faults
M Agoyan, JM Dutertre, D Naccache, B Robisson, A Tria
International conference on smart card research and advanced applications …, 2010
1962010
Electromagnetic transient faults injection on a hardware and a software implementations of AES
A Dehbaoui, JM Dutertre, B Robisson, A Tria
2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 7-15, 2012
1822012
Fault model analysis of laser-induced faults in sram memory cells
C Roscian, A Sarafianos, JM Dutertre, A Tria
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 89-98, 2013
952013
How to flip a bit?
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE 16th International On-Line Testing Symposium, 235-239, 2010
822010
Efficiency of a glitch detector against electromagnetic fault injection
L Zussa, A Dehbaoui, K Tobich, JM Dutertre, P Maurine, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
732014
Injection of transient faults using electromagnetic pulses-Practical results on a cryptographic system-.
A Dehbaoui, JM Dutertre, B Robisson, P Orsatelli, P Maurine, A Tria
IACR Cryptology EPrint Archive 2012, 123, 2012
722012
Frontside laser fault injection on cryptosystems-Application to the AES'last round
C Roscian, JM Dutertre, A Tria
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
642013
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values
M Doulcier-Verdier, JM Dutertre, J Fournier, JB Rigaud, B Robisson, ...
2011 IEEE International Solid-State Circuits Conference, 274-276, 2011
522011
A DFA on AES Based on the Entropy of Error Distributions
R Lashermes, G Reymond, JM Dutertre, J Fournier, B Robisson, A Tria
2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 34-43, 2012
512012
Electromagnetic glitch on the AES round counter
A Dehbaoui, AP Mirbaha, N Moro, JM Dutertre, A Tria
International Workshop on Constructive Side-Channel Analysis and Secure …, 2013
502013
Evidence of a larger EM-induced fault model
S Ordas, L Guillaume-Sage, K Tobich, JM Dutertre, P Maurine
International Conference on Smart Card Research and Advanced Applications …, 2014
432014
Investigation of timing constraints violation as a fault injection means
L Zussa, JM Dutertre, J Clédiere, B Robisson, A Tria
27th Conference on Design of Circuits and Integrated Systems (DCIS), Avignon …, 2012
432012
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism
L Zussa, JM Dutertre, J Clediere, A Tria
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 110-115, 2013
422013
Single-bit DFA using multiple-byte laser fault injection
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE International Conference on Technologies for Homeland Security …, 2010
412010
Laser-induced single-bit faults in flash memory: Instructions corruption on a 32-bit microcontroller
B Colombier, A Menu, JM Dutertre, PA Moëllic, JB Rigaud, JL Danger
2019 IEEE International Symposium on Hardware Oriented Security and Trust …, 2019
302019
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
JM Dutertre, RP Bastos, O Potin, ML Flottes, B Rouzeyre, G Di Natale, ...
Microelectronics Reliability 54 (9-10), 2289-2294, 2014
292014
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
A Sarafianos, O Gagliano, V Serradeil, M Lisart, JM Dutertre, A Tria
2013 IEEE International Reliability Physics Symposium (IRPS), 5B. 5.1-5B. 5.9, 2013
282013
Review of fault injection mechanisms and consequences on countermeasures design
JM Dutertre, JJA Fournier, AP Mirbaha, D Naccache, JB Rigaud, ...
2011 6th International Conference on Design & Technology of Integrated …, 2011
262011
Fault round modification analysis of the advanced encryption standard
JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria, T Vaschalde
2012 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2012
252012
A bulk built-in sensor for detection of fault attacks
RP Bastos, FS Torres, JM Dutertre, ML Flottes, G Di Natale, B Rouzeyre
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
232013
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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