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Hojin LeeSoongsil UniversityEmail verificata su ssu.ac.kr
Shaoqin Sarah GongProfessor, University of Wisconsin-Madison, Dept. of Biomedical Engineering and WIDEmail verificata su engr.wisc.edu
Aldo BadanoFDAEmail verificata su fda.hhs.gov
Michael C. HamiltonAuburn University - Electrical and Computer EngineeringEmail verificata su auburn.edu
Patrick B. SheaEmail verificata su umich.edu
Eric Kai-Hsiang Yu, PhDApple Inc, University of MichiganEmail verificata su umich.edu
John RobertsonProfessor of Electronics, University of CambridgeEmail verificata su eng.cam.ac.uk
Hiroko YamadaNara Institute of Science and TechnologyEmail verificata su ms.naist.jp
Miltiadis HatalisProfessor of Lehigh UniversityEmail verificata su lehigh.edu
Anastasios C. KonstantinidisClinical Scientist in Diagnostic Radiology & Radiation ProtectionEmail verificata su porthosp.nhs.uk
Erdogan GulariProfessor of Chemical Engineering, University of MichiganEmail verificata su umich.edu
Toshio KamiyaTokyo Institute of TechnologyEmail verificata su msl.titech.ac.jp
Naftali E. LustigIBM Systems and TechnologyEmail verificata su us.ibm.com
Julian Hyunsoo KimEECS, University of MichiganEmail verificata su umich.edu
James StathisIBM ResearchEmail verificata su us.ibm.com
David C. MartinKarl W. and Renate Böer Professor of Materials Science and Engineering and Biomedical EngineeringEmail verificata su udel.edu
Sadanand DeshpandeGlobalfoundries SingaporeEmail verificata su globalfoundries.com
Edward F. KelleyKELTEKEmail verificata su keltekresearch.com
Jihua ChenCenter for Nanophase Materials Sciences, Oak Ridge National LabEmail verificata su ornl.gov
Fred TerryUniversity of MichiganEmail verificata su umich.edu
Jerzy Kanicki
Professor of EECS, University of Michigan
Email verificata su eecs.umich.edu - Home page