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Alexander Pooth
Alexander Pooth
Ampleon BV
Email verificata su rwth-aachen.de
Titolo
Citata da
Citata da
Anno
“Leaky Dielectric” Model for the Suppression of Dynamic in Carbon-Doped AlGaN/GaN HEMTs
MJ Uren, S Karboyan, I Chatterjee, A Pooth, P Moens, A Banerjee, ...
IEEE Transactions on Electron Devices 64 (7), 2826-2834, 2017
2172017
Fabrication of p-channel heterostructure field effect transistors with polarization-induced two-dimensional hole gases at metal–polar GaN/AlInGaN interfaces
B Reuters, H Hahn, A Pooth, B Holländer, U Breuer, M Heuken, H Kalisch, ...
Journal of Physics D: Applied Physics 47 (17), 175103, 2014
872014
P-channel enhancement and depletion mode GaN-based HFETs with quaternary backbarriers
H Hahn, B Reuters, A Pooth, B Holländer, M Heuken, H Kalisch, A Vescan
IEEE transactions on electron devices 60 (10), 3005-3011, 2013
752013
Lateral charge transport in the carbon-doped buffer in AlGaN/GaN-on-Si HEMTs
I Chatterjee, MJ Uren, S Karboyan, A Pooth, P Moens, A Banerjee, ...
IEEE Transactions on Electron Devices 64 (3), 977-983, 2017
422017
Charge movement in a GaN-based hetero-structure field effect transistor structure with carbon doped buffer under applied substrate bias
A Pooth, MJ Uren, M Cäsar, T Martin, M Kuball
Journal of Applied Physics 118 (21), 2015
352015
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs
A Pooth, J Bergsten, N Rorsman, H Hirshy, R Perks, P Tasker, T Martin, ...
Microelectronics Reliability 68, 2-4, 2017
172017
First small-signal data of GaN-based p-channel heterostructure field effect transistors
H Hahn, B Reuters, A Pooth, A Noculak, H Kalisch, A Vescan
Japanese Journal of Applied Physics 52 (12R), 128001, 2013
162013
Characterization of GaN-based p-channel device structures at elevated temperatures
H Hahn, B Reuters, A Pooth, H Kalisch, A Vescan
Semiconductor Science and Technology 29 (7), 075002, 2014
142014
Impact of buffer charge on the reliability of carbon doped AlGaN/GaN-on-Si HEMTs
I Chatterjee, MJ Uren, A Pooth, S Karboyan, S Martin-Horcajo, M Kuball, ...
2016 IEEE International Reliability Physics Symposium (IRPS), 4A-4-1-4A-4-5, 2016
72016
Floating body effects in carbon doped GaN HEMTs
M Kuball, MJ Uren, A Pooth, S Karboyan, WM Waller, I Chatterjee
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2015
52015
The development of a European industrial source of GaN epitaxy for RF applications at IQE Europe
T Martin, PJ Wright, R Blunt, A Pooth, C Liu, A Gott, L Lees
2014 9th European Microwave Integrated Circuit Conference, 218-220, 2014
12014
Investigation of buffer charging effects in GaN-based transistors
A Pooth
University of Bristol, 2018
2018
Back Bias Ramping and Photoionization Spectroscopy Analysis of GaN-on-Si HFETs
A Pooth, T Martin, MJ Uren, M Kuball
31st Annual International Conference on Compound Semiconductor Manufacturing …, 2016
2016
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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