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- Rhesa NathanaelDepartment of Electrical Engineering and Computer Sciences, University of California, BerkeleyEmail verificata su eecs.berkeley.edu
- Vladimir StojanovicProfessor of Electrical Engineering and Computer Sciences, University of CaliforniaEmail verificata su berkeley.edu
- Hossein FariborziHyperlumeEmail verificata su hyperlume.com
- Matthew SpencerHarvey Mudd CollegeEmail verificata su g.hmc.edu
- Dejan MarkovicProfessor of Electrical and Computer Engineering, UCLAEmail verificata su ee.ucla.edu
- Louis HutinCEA LetiEmail verificata su cea.fr
- Yanbiao PanTexas InstrumentsEmail verificata su rutgers.edu
- Fangzhou YuRutgers, The State University of New JerseyEmail verificata su scarletmail.rutgers.edu
- Yenhao (Philip) ChenUniversity of California at BerkeleyEmail verificata su eecs.berkeley.edu
- Qingze ZouRutgers, the State University of New JerseyEmail verificata su rci.rutgers.edu
- Ming LuStaff Scientist, Brookhaven National LaboratoryEmail verificata su bnl.gov
- Borivoje NikolicUniversity of California BerkeleyEmail verificata su berkeley.edu
- Ruzica JevticUniversidad CEU San PabloEmail verificata su ceu.es
- Kang L. WangElectrical Engineering DepartmentEmail verificata su ee.ucla.edu
- Faxian XiuPhysics Department, Fudan UniversityEmail verificata su fudan.edu.cn
- Rinus LeeTELEmail verificata su ieee.org
- Vivek SubramanianEcole polytechnique Federale de Lausanne (EPFL)Email verificata su epfl.ch
- Nuo XuTSMC; Samsung; IMEC; Synopsys; UC BerkeleyEmail verificata su eecs.berkeley.edu
- Olivier WeberSTMicroelectronicsEmail verificata su st.com
- Yang Y SCSIRO ManufacturingEmail verificata su csiro.au