A low-cost reliability vs. cost trade-off methodology to selectively harden logic circuits I Wali, B Deveautour, A Virazel, A Bosio, P Girard, M Sonza Reorda Journal of Electronic Testing 33, 25-36, 2017 | 19 | 2017 |
Qamr: an approximation-based fully reliable tmr alternative for area overhead reduction B Deveautour, M Traiola, A Virazel, P Girard 2020 IEEE European test symposium (ETS), 1-6, 2020 | 16 | 2020 |
Emerging computing devices: Challenges and opportunities for test and reliability A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ... 2021 IEEE European test symposium (ETS), 1-10, 2021 | 11 | 2021 |
Reducing overprovision of triple modular reduncancy owing to approximate computing B Deveautour, M Traiola, A Virazel, P Girard 2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021 | 5 | 2021 |
Input-aware approximate computing A Piri, S Saeedi, M Barbareschi, B Deveautour, S Di Carlo, I O’Connor, ... 2022 IEEE International Conference on Automation, Quality and Testing …, 2022 | 3 | 2022 |
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ... 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 3 | 2020 |
On using approximate computing to build an error detection scheme for arithmetic circuits B Deveautour, A Virazel, P Girard, V Gherman Journal of Electronic Testing 36, 33-46, 2020 | 3 | 2020 |
Test and reliability of approximate hardware M Traiola, B Deveautour, A Bosio, P Girard, A Virazel Approximate Computing, 233-266, 2022 | 2 | 2022 |
A low-cost susceptibility analysis methodology to selectively harden logic circuits I Wali, B Deveautour, A Virazel, A Bosio, P Girard, MS Reorda 2016 21th IEEE European Test Symposium (ETS), 1-2, 2016 | 2 | 2016 |
Energy-efficient Computation-In-Memory Architecture using Emerging Technologies R Bishnoi, S Diware, A Gebregiorgis, S Thomann, S Mannaa, ... 2023 International Conference on Microelectronics (ICM), 325-334, 2023 | 1 | 2023 |
3D Logic circuit design oriented electrothermal modeling of vertical junctionless nanowire FETs S Mannaa, A Poittevin, C Marchand, D Deleruyelle, B Deveautour, ... IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023 | 1 | 2023 |
Vnwfet-based technology: From device modelling to standard cell library S Mannaa, C Marchand, D Deleruyelle, B Deveautour, I O'Connor, ... 2023 IEEE 23rd International Conference on Nanotechnology (NANO), 576-581, 2023 | 1 | 2023 |
Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator S Pappalardo, A Ruospo, I O’Connor, B Deveautour, E Sanchez, A Bosio 2023 26th International Symposium on Design and Diagnostics of Electronic …, 2023 | 1 | 2023 |
A Fault Injection Framework for AI Hardware Accelerators S Pappalardo, A Ruospo, I O'Connor, B Deveautour, E Sanchez, A Bosio 2023 IEEE 24th Latin American Test Symposium (LATS), 1-6, 2023 | 1 | 2023 |
Is aproximate computing suitable for selective hardening of arithmetic circuits? B Deveautour, A Virazel, P Girard, S Pravossoudovitch, V Gherman 2018 13th International Conference on Design & Technology of Integrated …, 2018 | 1 | 2018 |
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators M Taheri, M Daneshtalab, J Raik, M Jenihhin, S Pappalardo, P Jimenez, ... arXiv preprint arXiv:2403.02946, 2024 | | 2024 |
Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator S Pappalardo, A Piri, A Ruospo, I O’Connor, B Deveautour, E Sanchez, ... 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | | 2023 |
Input-aware accuracy characterization for approximate circuits A Piri, S Pappalardo, S Barone, M Barbareschi, B Deveautour, M Traiola, ... 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems …, 2023 | | 2023 |
Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks A Bosio, B Deveautour, I O'Connor 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 326-326, 2022 | | 2022 |
Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope? C Bolchini, A Bosio, L Cassano, B Deveautour, G Di Natale, A Miele, ... 2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022 | | 2022 |