Segui
Bastien Deveautour
Bastien Deveautour
CPE Lyon / INL
Email verificata su cpe.fr
Titolo
Citata da
Citata da
Anno
A low-cost reliability vs. cost trade-off methodology to selectively harden logic circuits
I Wali, B Deveautour, A Virazel, A Bosio, P Girard, M Sonza Reorda
Journal of Electronic Testing 33, 25-36, 2017
192017
Qamr: an approximation-based fully reliable tmr alternative for area overhead reduction
B Deveautour, M Traiola, A Virazel, P Girard
2020 IEEE European test symposium (ETS), 1-6, 2020
162020
Emerging computing devices: Challenges and opportunities for test and reliability
A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ...
2021 IEEE European test symposium (ETS), 1-10, 2021
112021
Reducing overprovision of triple modular reduncancy owing to approximate computing
B Deveautour, M Traiola, A Virazel, P Girard
2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021
52021
Input-aware approximate computing
A Piri, S Saeedi, M Barbareschi, B Deveautour, S Di Carlo, I O’Connor, ...
2022 IEEE International Conference on Automation, Quality and Testing …, 2022
32022
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ...
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
32020
On using approximate computing to build an error detection scheme for arithmetic circuits
B Deveautour, A Virazel, P Girard, V Gherman
Journal of Electronic Testing 36, 33-46, 2020
32020
Test and reliability of approximate hardware
M Traiola, B Deveautour, A Bosio, P Girard, A Virazel
Approximate Computing, 233-266, 2022
22022
A low-cost susceptibility analysis methodology to selectively harden logic circuits
I Wali, B Deveautour, A Virazel, A Bosio, P Girard, MS Reorda
2016 21th IEEE European Test Symposium (ETS), 1-2, 2016
22016
Energy-efficient Computation-In-Memory Architecture using Emerging Technologies
R Bishnoi, S Diware, A Gebregiorgis, S Thomann, S Mannaa, ...
2023 International Conference on Microelectronics (ICM), 325-334, 2023
12023
3D Logic circuit design oriented electrothermal modeling of vertical junctionless nanowire FETs
S Mannaa, A Poittevin, C Marchand, D Deleruyelle, B Deveautour, ...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023
12023
Vnwfet-based technology: From device modelling to standard cell library
S Mannaa, C Marchand, D Deleruyelle, B Deveautour, I O'Connor, ...
2023 IEEE 23rd International Conference on Nanotechnology (NANO), 576-581, 2023
12023
Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator
S Pappalardo, A Ruospo, I O’Connor, B Deveautour, E Sanchez, A Bosio
2023 26th International Symposium on Design and Diagnostics of Electronic …, 2023
12023
A Fault Injection Framework for AI Hardware Accelerators
S Pappalardo, A Ruospo, I O'Connor, B Deveautour, E Sanchez, A Bosio
2023 IEEE 24th Latin American Test Symposium (LATS), 1-6, 2023
12023
Is aproximate computing suitable for selective hardening of arithmetic circuits?
B Deveautour, A Virazel, P Girard, S Pravossoudovitch, V Gherman
2018 13th International Conference on Design & Technology of Integrated …, 2018
12018
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
M Taheri, M Daneshtalab, J Raik, M Jenihhin, S Pappalardo, P Jimenez, ...
arXiv preprint arXiv:2403.02946, 2024
2024
Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator
S Pappalardo, A Piri, A Ruospo, I O’Connor, B Deveautour, E Sanchez, ...
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023
2023
Input-aware accuracy characterization for approximate circuits
A Piri, S Pappalardo, S Barone, M Barbareschi, B Deveautour, M Traiola, ...
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems …, 2023
2023
Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks
A Bosio, B Deveautour, I O'Connor
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 326-326, 2022
2022
Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope?
C Bolchini, A Bosio, L Cassano, B Deveautour, G Di Natale, A Miele, ...
2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022
2022
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20