Prasad Bokil
Prasad Bokil
Scientist, Tata Research Development and Design Centre
Verified email at tcs.com
Title
Cited by
Cited by
Year
Automatic test data generation for c programs
P Bokil, P Darke, U Shrotri, R Venkatesh
Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009 …, 2009
352009
Test generation for large automotive models
R Venkatesh, U Shrotri, P Darke, P Bokil
Industrial Technology (ICIT), 2012 IEEE International Conference on, 662-667, 2012
242012
Effectiveness of random testing of embedded systems
P Krishnan, R Venkatesh, P Bokil, T Muske, V Suman
2012 45th Hawaii International Conference on System Sciences, 5556-5563, 2012
112012
TIC: a scalable model checking based approach to WCET estimation
R Metta, M Becker, P Bokil, S Chakraborty, R Venkatesh
Proceedings of the 17th ACM SIGPLAN/SIGBED Conference on Languages …, 2016
82016
System and method for automatic test data generation for relational testing
VS Pasupuleti, T Muske, P Bokil, U Shrotri, V Ramanathan, P Darke
US Patent 8,589,736, 2013
72013
Achieving Effective Test Suites for Reactive Systems using Specification Mining and Test Suite Reduction Techniques
P Bokil, P Krishnan, R Venkatesh
ACM SIGSOFT Software Engineering Notes 40 (1), 1-8, 2015
62015
On implementational variations in static analysis tools
T Muske, P Bokil
2015 IEEE 22nd International Conference on Software Analysis, Evolution and …, 2015
52015
Masking boundary value coverage: Effectiveness and efficiency
PV Suman, T Muske, P Bokil, U Shrotri, R Venkatesh
Testing–Practice and Research Techniques, 8-22, 2010
42010
STATEMATE to SCADE model translation
R Venky, S Ulka, A Kulkarni, P Bokil
Proceedings of the 1st India software engineering conference, 145-146, 2008
32008
Generating Effective Test Suites for Reactive Systems Using Specification Mining
P Bokil
12014
The system can't perform the operation now. Try again later.
Articles 1–10