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- Kevin S. JonesProfessor, University of FloridaEmail verificata su eng.ufl.edu
- Stephen PeartonProfessor of Materials Science and Engineering, University of FloridaEmail verificata su mse.ufl.edu
- Erin PatrickInstructional Associate Professor, University of FloridaEmail verificata su ece.ufl.edu
- Fan RenUniversity of Florida, Bell Lab, AT&TEmail verificata su che.ufl.edu
- Ribhu SharmaUniversity of Florida; Infineon TechnologiesEmail verificata su ufl.edu
- SOKRATES T. PANTELIDESProfessor of Physics, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Tomas Diaz de la RubiaUniversity of OklahomaEmail verificata su ou.edu
- Leonard RubinAxcelis TechnologiesEmail verificata su alum.mit.edu
- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- blair tuttlePenn State Erie; The Behrend CollegeEmail verificata su psu.edu
- Yaser M. HaddaraMcMaster UniversityEmail verificata su mcmaster.ca
- Marko J. TadjerNaval Research LaboratoryEmail verificata su nrl.navy.mil
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Robert EllimanAustralian National UniversityEmail verificata su anu.edu.au
- Lu LiuUniversity of Florida, Stanford UniversityEmail verificata su stanford.edu
- S. T. PicrauxLos Alamos National LaboratoryEmail verificata su lanl.gov
- Eric ChasonBrown UniversityEmail verificata su brown.edu
- Minghan XianMicron Technology; University of Florida; University of DelawareEmail verificata su ufl.edu
- Saurabh MorarkaEmail verificata su intel.com
- Martin GilesIntel Corporation, RetiredEmail verificata su ieee.org