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Andrea Schirru
Andrea Schirru
Affiliazione sconosciuta
Email verificata su unipv.it
Titolo
Citata da
Citata da
Anno
Machine learning for predictive maintenance: A multiple classifier approach
GA Susto, A Schirru, S Pampuri, S McLoone, A Beghi
IEEE transactions on industrial informatics 11 (3), 812-820, 2014
5982014
Supervised aggregative feature extraction for big data time series regression
GA Susto, A Schirru, S Pampuri, S McLoone
IEEE Transactions on Industrial Informatics 12 (3), 1243-1252, 2015
662015
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach
GA Susto, S Pampuri, A Schirru, A Beghi, G De Nicolao
Computers & Operations Research 53, 328-337, 2015
562015
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing
S Pampuri, A Schirru, G Fazio, G De Nicolao
Automation Science and Engineering (CASE), 2011 IEEE Conference on, 244-249, 2011
342011
Automatic control and machine learning for semiconductor manufacturing: Review and challenges
GA Susto, S Pampuri, A Schirru, G De Nicolao, SF McLoone, A Beghi
Proceedings of the 10th European Workshop on Advanced Control and Diagnosis …, 2012
312012
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing
GA Susto, A Schirru, S Pampuri, A Beghi, G De Nicolao
Control Engineering Practice 74, 84-94, 2018
302018
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing
A Schirru, S Pampuri, G De Nicolao
Automation Science and Engineering (CASE), 2010 IEEE Conference on, 51-56, 2010
282010
Multilevel Kernel Methods for Virtual Metrology in Semiconductor Manufacturing⋆
A Schirru, S Pampuri, C De Luca, G De Nicolao
World Congress 18 (1), 11614-11621, 2011
252011
A predictive maintenance system based on regularization methods for ion-implantation
GA Susto, A Schirru, S Pampuri, A Beghi
2012 semi advanced semiconductor manufacturing conference, 175-180, 2012
232012
A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation
GA Susto, A Schirru, S Pampuri, D Pagano, S McLoone, A Beghi
2013 IEEE international conference on automation science and engineering …, 2013
222013
Multistep virtual metrology approaches for semiconductor manufacturing processes
S Pampuri, A Schirru, GA Susto, C De Luca, A Beghi, G De Nicolao
2012 IEEE International Conference on Automation Science and Engineering …, 2012
222012
Learning from time series: Supervised aggregative feature extraction
A Schirru, GA Susto, S Pampuri, S McLoone
2012 IEEE 51st IEEE Conference on Decision and Control (CDC), 5254-5259, 2012
212012
Prediction of integral type failures in semiconductor manufacturing through classification methods
GA Susto, S McLoone, D Pagano, A Schirru, S Pampuri, A Beghi
2013 IEEE 18th Conference on Emerging Technologies & Factory Automation …, 2013
172013
An information-theory and virtual metrology-based approach to run-to-run semiconductor manufacturing control
GA Susto, A Schirru, S Pampuri, G De Nicolao, A Beghi
2012 IEEE International Conference on Automation Science and Engineering …, 2012
172012
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing
A Schirru, S Pampuri, G De Nicolao
Automation Science and Engineering (CASE), 2010 IEEE Conference on, 57-62, 2010
152010
Optimal tuning of epitaxy pyrometers
GA Susto, S Pampuri, A Schirru, A Beghi
2012 SEMI Advanced Semiconductor Manufacturing Conference, 294-299, 2012
132012
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing
S Pampuri, A Schirru, C De Luca, G De Nicolao
Automation Science and Engineering (CASE), 2011 IEEE Conference on, 250-255, 2011
102011
A fraud detection decision support system via human on-line behavior characterization and machine learning
GA Susto, M Terzi, C Masiero, S Pampuri, A Schirru
2018 First International Conference on Artificial Intelligence for …, 2018
52018
Efficient Marginal Likelihood Computation for Gaussian Process Regression
A Schirru, S Pampuri, G De Nicolao, S McLoone
Arxiv preprint arXiv:1110.6546, 2011
52011
MSC-clustering and forward stepwise regression for virtual metrology in highly correlated input spaces
PKS Prakash, A Schirru, P Hung, S McLoone
2012 SEMI Advanced Semiconductor Manufacturing Conference, 45-50, 2012
42012
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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