Crea il mio profilo
Accesso pubblico
Visualizza tutto20 articoli
4 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
- Edward SargentNorthwestern University & University of TorontoEmail verificata su northwestern.edu
- Dirk BouwmeesterUniversity of California Santa Barbara & Leiden UniversityEmail verificata su ucsb.edu
- Sjoerd HooglandDepartment of Electrical and Computer Engineering, University of TorontoEmail verificata su utoronto.ca
- Alexander H. IpCERT SystemsEmail verificata su utoronto.ca
- Andre J LabelleElectrical and Computer Engineering, University of TorontoEmail verificata su mail.utoronto.ca
- Pierre PetroffEmail verificata su ucsb.edu
- Oleksandr VoznyyAssistant Professor at University of TorontoEmail verificata su utoronto.ca
- Hyochul KimSamsung Advanced Institute of TechnologyEmail verificata su samsung.com
- Graham H. CareyPhD student, University of TorontoEmail verificata su mail.utoronto.ca
- Illan KramerUniversity of TorontoEmail verificata su utoronto.ca
- Ebuka S. ArinzeJohns Hopkins University, Electrical and Computer EngineeringEmail verificata su jhu.edu
- David ZhitomirskyMITEmail verificata su mit.edu
- Ratan DebnathNational Institute of Standards and Technology (NIST), Gaithersburg, USAEmail verificata su nist.gov
- Aram AmassianProfessor of Materials Science and Engineering, North Carolina State UniversityEmail verificata su ncsu.edu
- Botong QiuJohns Hopkins UniversityEmail verificata su jhu.edu
- Kang Wei ChouHenkelEmail verificata su henkel.com
- Yida LinThe Johns Hopkins UniversitEmail verificata su jhu.edu
- Yan ChengJohns Hopkins UniversityEmail verificata su jhu.edu
- Osman BakrProfessor, Materials Science & Eng., King Abdullah University of Science and Technology (KAUST)Email verificata su kaust.edu.sa
- Arlene ChiuJohns Hopkins University, Electrical and Computer EngineeringEmail verificata su jhu.edu
Segui
Susanna Thon
Johns Hopkins University, Electrical and Computer Engineering
Email verificata su jhu.edu - Home page