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Ke Zeng
Ke Zeng
UNC Charlotte | Stanford University | University at Buffalo- SUNY
Email verificata su uncc.edu - Home page
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Citata da
Citata da
Anno
1.85 kV Breakdown Voltage in Lateral Field-Plated Ga2O3MOSFETs
K Zeng, A Vaidya, U Singisetti
IEEE Electron Device Letters 39 (9), 1385-1388, 2018
2132018
Field-Plated Lateral Ga2O3 MOSFETs With Polymer Passivation and 8.03 kV Breakdown Voltage
S Sharma, K Zeng, S Saha, U Singisetti
IEEE Electron Device Letters 41 (6), 836-839, 2020
1952020
Ga2O3 MOSFETs Using Spin-On-Glass Source/Drain Doping Technology
K Zeng, JS Wallace, C Heimburger, K Sasaki, A Kuramata, T Masui, ...
IEEE Electron Device Letters 38 (4), 513-516, 2017
1402017
Device-Level thermal management of gallium oxide field-effect transistors
B Chatterjee, K Zeng, CD Nordquist, U Singisetti, S Choi
IEEE Transactions on Components, Packaging and Manufacturing Technology 9 …, 2019
1202019
Interface State Density in Atomic Layer Deposited SiO2/-Ga2O3() MOSCAPs
K Zeng, Y Jia, U Singisetti
IEEE Electron Device Letters 37 (7), 906-909, 2016
1022016
Spectroscopic and electrical calculation of band alignment between atomic layer deposited SiO2 and β-Ga2O3 (2¯ 01)
Y Jia, K Zeng, JS Wallace, JA Gardella, U Singisetti
Applied Physics Letters 106 (10), 2015
1012015
A field-plated Ga2O3 MOSFET with near 2-kV breakdown voltage and 520 mΩ· cm2 on-resistance
K Zeng, A Vaidya, U Singisetti
Applied Physics Express 12 (8), 081003, 2019
812019
Flexible β‐Ga2O3 Nanomembrane Schottky Barrier Diodes
E Swinnich, MN Hasan, K Zeng, Y Dove, U Singisetti, B Mazumder, ...
Advanced Electronic Materials 5 (3), 1800714, 2019
642019
Temperature dependent quasi-static capacitance-voltage characterization of SiO2/β-Ga2O3 interface on different crystal orientations
K Zeng, U Singisetti
Applied Physics Letters 111 (12), 2017
462017
Designing Beveled Edge Termination in GaN Vertical pin Diode-Bevel Angle, Doping, and Passivation
K Zeng, S Chowdhury
IEEE Transactions on Electron Devices 67 (6), 2457-2462, 2020
342020
Depletion and enhancement mode β-Ga 2 O 3 MOSFETs with ALD SiO 2 gate and near 400 V breakdown voltage
K Zeng, K Sasaki, A Kuramata, T Masui, U Singisetti
74th Device Research Conference (DRC), 1-2, 2016
252016
2.8 kV Avalanche in Vertical GaN PN Diode Utilizing Field Plate on Hydrogen Passivated P-Layer
Z Bian, K Zeng, S Chowdhury
IEEE Electron Device Letters 43 (4), 596-599, 2022
242022
Vertical Ga2O3 MOSFET With Magnesium Diffused Current Blocking Layer
K Zeng, R Soman, Z Bian, S Jeong, S Chowdhury
IEEE Electron Device Letters 43 (9), 1527-1530, 2022
212022
A field-plated Ga₂O₃ MOSFET with near 2-kV breakdown voltage and 520 mΩ· cm² on-resistance
K Zeng, A Vaidya, U Singisetti
Appl. Phys. Exp. 12 (8), 2019
202019
Mixed-mode circuit simulation to characterize Ga2O3 MOSFETs in different device structures
I Lee, A Kumar, K Zeng, U Singisetti, X Yao
2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2017
152017
Modeling and power loss evaluation of ultra wide band gap Ga2O3 device for high power applications
I Lee, A Kumar, K Zeng, U Singisetti, X Yao
Energy Conversion Congress and Exposition (ECCE), 2017 IEEE, 4377-4382, 2017
152017
Interface characterization of atomic layer deposited high-k on non-polar GaN
Y Jia, K Zeng, U Singisetti
Journal of Applied Physics 122 (15), 2017
142017
Study on Avalanche Uniformity in 1.2 KV GaN Vertical PIN Diode with Bevel Edge-Termination
K Zeng, S Chowdhury, B Gunning, R Kaplar, T Anderson
2021 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2021
122021
Development of High-Voltage Vertical GaN PN Diodes
RJ Kaplar, BP Gunning, AA Allerman, MH Crawford, JD Flicker, ...
2020 IEEE International Electron Devices Meeting (IEDM), 5.1. 1-5.1. 4, 2020
92020
710 V Breakdown Voltage in Field Plated Ga203 MOSFET
K Zeng, A Vaidya, U Singisetti
2018 76th Device Research Conference (DRC), 1-2, 2018
72018
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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