Follow
Shyam Kumar Devarakond
Shyam Kumar Devarakond
Low Yield Analysis Engineer, Intel
Verified email at gatech.edu
Title
Cited by
Cited by
Year
A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations
V Natarajan, S Sen, SK Devarakond, A Chatterjee
2010 28th VLSI Test Symposium (VTS), 331-336, 2010
302010
Yield recovery of RF transceiver systems using iterative tuning-driven power-conscious performance optimization
V Natarajan, A Banerjee, S Sen, S Devarakond, A Chatterjee
IEEE Design & Test 32 (1), 61-69, 2014
292014
Process-variation tolerant channel-adaptive virtually zero-margin low-power wireless receiver systems
S Sen, V Natarajan, S Devarakond, A Chatterjee
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
282014
Phase distortion to amplitude conversion-based low-cost measurement of AM-AM and AM-PM effects in RF power amplifiers
S Sen, S Devarakond, A Chatterjee
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (9 …, 2011
262011
Real-time use-aware adaptive RF transceiver systems for energy efficiency under BER constraints
D Banerjee, SK Devarakond, X Wang, S Sen, A Chatterjee
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
252015
BIST driven power conscious post-manufacture tuning of wireless transceiver systems using hardware-iterated gradient search
V Natarajan, SK Devarakond, S Sen, A Chatterjee
2009 Asian Test Symposium, 243-248, 2009
242009
Concurrent device/specification cause–effect monitoring for yield diagnosis using alternate diagnostic signatures
SK Devarakond, S Sen, S Bhattacharya, A Chatterjee
IEEE Design & Test of Computers 29 (1), 48-58, 2011
232011
DSP assisted low cost IQ mismatch measurement and compensation using built in power detector
S Sen, SK Devarakond, A Chatterjee
2010 IEEE MTT-S International Microwave Symposium, 336-339, 2010
222010
Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints
D Banerjee, S Devarakond, S Sen, A Chatterjee
Proceedings of the 50th Annual Design Automation Conference, 1-7, 2013
192013
Iterative built-in testing and tuning of mixed-signal/RF systems
A Chatterjee, D Han, V Natarajan, S Devarakond, S Sen, H Choi, ...
2009 IEEE International Conference on Computer Design, 319-326, 2009
182009
Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations
S Sen, S Devarakond, A Chatterjee
2009 International Test Conference, 1-10, 2009
162009
BIST-assisted power aware self healing RF circuits
SK Devarakond, V Natarajan, S Sen, A Chatterjee
2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test …, 2009
152009
Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures
A Banerjee, S Sen, SK Devarakond, A Chatterjee
29th VLSI Test Symposium, 58-63, 2011
142011
Digitally assisted concurrent built-in tuning of rf systems using hamming distance proportional signatures
S Devarakond, S Sen, V Natarajan, A Banerjee, H Choi, G Srinivasan, ...
2010 19th IEEE Asian Test Symposium, 283-288, 2010
142010
Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits
A Chatterjee, S Deyati, B Muldrey, S Devarakond, A Banerjee
Proceedings of the International Conference on Computer-Aided Design, 553-556, 2012
112012
Accurate signature driven power conscious tuning of RF systems using hierarchical performance models
A Banerjee, S Sen, S Devarakond, A Chatterjee
2011 IEEE International Test Conference, 1-9, 2011
102011
Optimized digital compatible pulse sequences for testing of RF front end modules
A Banerjee, SK Devarakond, V Natarajan, S Sen, A Chatterjee
2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test …, 2010
92010
Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters
S Devarakond, D Banerjee, A Banerjee, S Sen, A Chatterjee
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
62013
Predicting die-level process variations from wafer test data for analog devices: A feasibility study
S Devarakond, J McCoy, A Nahar, JM Carulli, S Bhattacharya, ...
2013 14th Latin American Test Workshop-LATW, 1-6, 2013
52013
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation
SK Devarakond, S Sen, A Banerjee, V Natarajan, A Chatterjee
2010 IEEE 16th International On-Line Testing Symposium, 77-82, 2010
52010
The system can't perform the operation now. Try again later.
Articles 1–20