Shawn Blanton
Shawn Blanton
Professor of Electrical and Computer Engineering, Carnegie Mellon University
Verified email at andrew.cmu.edu - Homepage
TitleCited byYear
A logic diagnosis methodology for improved localization and extraction of accurate defect behavior
R Desineni, O Poku, RD Blanton
2006 IEEE International Test Conference, 1-10, 2006
1152006
Development of a MEMS testing methodology
A Kolpekwar, RD Blanton
Proceedings International Test Conference 1997, 923-931, 1997
781997
Virtual probe: a statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
X Li, RR Rutenbar, RD Blanton
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
592009
Statistical test compaction using binary decision trees
S Biswas, RD Blanton
IEEE Design & Test of Computers 23 (6), 452-462, 2006
582006
Analyzing the effectiveness of multiple-detect test sets
S Blanton, K Dwarakanath, A Shah
International Test Conference, 876-885, 2003
582003
Analysis of failure sources in surface-micromachined MEMS
N Deb, RD Blanton
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
572000
Specification test compaction for analog circuits and MEMS
S Biswas, P Li, RD Blanton, LT Pileggi
Proceedings of the conference on Design, Automation and Test in Europe …, 2005
552005
Hierarchical design and test of integrated microsystems
T Mukherjee, GK Fedder, RD Blanton
IEEE Design & Test of Computers 16 (4), 18-27, 1999
541999
CAEN-BIST: Testing the nanofabric
JG Brown, RD Blanton
2004 International Conferce on Test, 462-471, 2004
522004
Universal fault simulation using fault tuples
KN Dwarakanath, RD Blanton
Proceedings of the 37th Annual Design Automation Conference, 786-789, 2000
512000
Properties of the input pattern fault model
RD Blanton, JP Hayes
Proceedings International Conference on Computer Design VLSI in Computers …, 1997
501997
Modeling the economics of testing: a DFT perspective
PK Nag, A Gattiker, S Wei, RD Blanton, W Maly
IEEE Design & Test of Computers 19 (1), 29-41, 2002
492002
Built-in self test of CMOS-MEMS accelerometers
N Deb, RD Blanton
Proceedings. International Test Conference, 1075-1084, 2002
482002
Virtual probe: a statistical framework for low-cost silicon characterization of nanoscale integrated circuits
W Zhang, X Li, F Liu, E Acar, RA Rutenbar, RD Blanton
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011
472011
Fault tuples in diagnosis of deep-submicron circuits
RD Blanton, JT Chen, R Desineni, KN Dwarakanath, W Maly, TJ Vogels
Proceedings. International Test Conference, 233-241, 2002
472002
System and method to test integrated circuits on a wafer
L Pileggi, CP Yue, RS Blanton, T Vogels
US Patent 7,325,180, 2008
462008
Diagnosis of arbitrary defects using neighborhood function extraction
R Desineni, RD Blanton
23rd IEEE VLSI Test Symposium (VTS'05), 366-373, 2005
462005
To DFT or not to DFT?
S Wei, PK Nag, RD Blanton, A Gattiker, W Maly
Proceedings International Test Conference 1997, 557-566, 1997
461997
Deformations of IC structure in test and yield learning
W Maly, A Gattiker, T Zanon, T Vogels, R Blanton, T Storey
ITC, 856-865, 2003
452003
Diagnostic test generation for arbitrary faults
NK Bhatti, RD Blanton
2006 IEEE International Test Conference, 1-9, 2006
432006
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