Shawn Blanton
Shawn Blanton
Professor of Electrical and Computer Engineering, Carnegie Mellon University
Verified email at andrew.cmu.edu - Homepage
Title
Cited by
Cited by
Year
A logic diagnosis methodology for improved localization and extraction of accurate defect behavior
R Desineni, O Poku, RD Blanton
2006 IEEE International Test Conference, 1-10, 2006
1172006
Development of a MEMS testing methodology
A Kolpekwar, RD Blanton
Proceedings International Test Conference 1997, 923-931, 1997
821997
Analyzing the effectiveness of multiple-detect test sets
S Blanton, K Dwarakanath, A Shah
International Test Conference, 876-885, 2003
622003
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
X Li, RR Rutenbar, RD Blanton
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
602009
Statistical test compaction using binary decision trees
S Biswas, RD Blanton
IEEE Design & Test of Computers 23 (6), 452-462, 2006
582006
Specification test compaction for analog circuits and mems [accelerometer and opamp examples]
S Biswas, P Li, RD Blanton, LT Pileggi
Design, Automation and Test in Europe, 164-169, 2005
562005
Analysis of failure sources in surface-micromachined MEMS
N Deb, RD Blanton
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000
552000
Hierarchical design and test of integrated microsystems
T Mukherjee, GK Fedder, RD Blanton
IEEE Design & Test of Computers 16 (4), 18-27, 1999
541999
Properties of the input pattern fault model
RD Blanton, JP Hayes
Proceedings International Conference on Computer Design VLSI in Computers …, 1997
541997
Universal fault simulation using fault tuples
KN Dwarakanath, RD Blanton
Proceedings of the 37th Annual Design Automation Conference, 786-789, 2000
532000
Modeling the economics of testing: a DFT perspective
PK Nag, A Gattiker, S Wei, RD Blanton, W Maly
IEEE Design & Test of Computers 19 (1), 29-41, 2002
512002
Virtual probe: a statistical framework for low-cost silicon characterization of nanoscale integrated circuits
W Zhang, X Li, F Liu, E Acar, RA Rutenbar, RD Blanton
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011
502011
CAEN-BIST: Testing the nanofabric
JG Brown, RD Blanton
2004 International Conferce on Test, 462-471, 2004
502004
To DFT or not to DFT?
S Wei, PK Nag, RD Blanton, A Gattiker, W Maly
Proceedings International Test Conference 1997, 557-566, 1997
491997
Built-in self test of CMOS-MEMS accelerometers
N Deb, RD Blanton
Proceedings. International Test Conference, 1075-1084, 2002
482002
Fault tuples in diagnosis of deep-submicron circuits
RD Blanton, JT Chen, R Desineni, KN Dwarakanath, W Maly, TJ Vogels
Proceedings. International Test Conference, 233-241, 2002
482002
Diagnosis of arbitrary defects using neighborhood function extraction
R Desineni, RD Blanton
23rd IEEE VLSI Test Symposium (VTS'05), 366-373, 2005
472005
Deformations of IC structure in test and yield learning
W Maly, A Gattiker, T Zanon, T Vogels, R Blanton, T Storey
ITC, 856-865, 2003
462003
System and method to test integrated circuits on a wafer
L Pileggi, CP Yue, RS Blanton, T Vogels
US Patent 7,325,180, 2008
452008
Diagnostic test generation for arbitrary faults
NK Bhatti, RD Blanton
2006 IEEE International Test Conference, 1-9, 2006
432006
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