Lorenzo Trevisanello
Lorenzo Trevisanello
Arianna
Verified email at ariannaled.com
Title
Cited by
Cited by
Year
A review on the reliability of GaN-based LEDs
M Meneghini, LR Trevisanello, G Meneghesso, E Zanoni
IEEE Transactions on Device and Materials Reliability 8 (2), 323-331, 2008
2782008
Accelerated life test of high brightness light emitting diodes
L Trevisanello, M Meneghini, G Mura, M Vanzi, M Pavesi, G Meneghesso, ...
IEEE Transactions on Device and Materials Reliability 8 (2), 304-311, 2008
1932008
High temperature electro-optical degradation of InGaN/GaN HBLEDs
M Meneghini, L Trevisanello, C Sanna, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 47 (9-11), 1625-1629, 2007
1032007
High-temperature degradation of GaN LEDs related to passivation
M Meneghini, LR Trevisanello, U Zehnder, T Zahner, U Strauss, ...
IEEE transactions on electron devices 53 (12), 2981-2987, 2006
832006
High brightness GaN LEDs degradation during dc and pulsed stress
M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ...
Microelectronics Reliability 46 (9-11), 1720-1724, 2006
652006
Thermal stability analysis of high brightness LED during high temperature and electrical aging
LR Trevisanello, M Meneghini, G Mura, C Sanna, S Buso, G Spiazzi, ...
Seventh International Conference on Solid State Lighting 6669, 666913, 2007
522007
Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs
M Meneghini, LR Trevisanello, U Zehnder, G Meneghesso, E Zanoni
IEEE transactions on electron devices 54 (12), 3245-3251, 2007
492007
A model for the thermal degradation of metal/ interface in GaN-based light emitting diodes
M Meneghini, L Rigutti, LR Trevisanello, A Cavallini, G Meneghesso, ...
Journal of Applied Physics 103 (6), 063703, 2008
422008
Extensive analysis of the degradation of phosphor-converted LEDs
M Meneghini, LR Trevisanello, F De Zuani, N Trivellin, G Meneghesso, ...
Ninth International Conference on Solid State Lighting 7422, 74220H, 2009
332009
Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions
M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ...
Sixth International Conference on Solid State Lighting 6337, 63370R, 2006
262006
Mounting structure for solid state light sources
G Hoetzl, HL Lim, T Preuschl, P Sachsenweger, LR Trevisanello, ...
US Patent 8,587,021, 2013
232013
High-temperature failure of GaN LEDs related with passivation
M Meneghini, L Trevisanello, G Meneghesso, E Zanoni, F Rossi, ...
Superlattices and Microstructures 40 (4-6), 405-411, 2006
222006
Thermally activated degradation and package instabilities of low flux LEDs
L Trevisanello, F De Zuani, M Meneghini, N Trivellin, E Zanoni, ...
2009 IEEE international reliability physics symposium, 98-103, 2009
192009
Failure mechanisms of gallium nitride LEDs related with passivation
M Meneghini, LR Trevisanello, S Levada, G Meneghesso, G Tamiazzo, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 4 …, 2005
142005
Lighting module for mounting onto a rail having an electrical contact
M Hast, LR Trevisanello, F Zanon
US Patent 8,926,134, 2015
112015
Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability
M Meneghini, N Trivellin, L Trevisanello, A Lunev, J Yang, Y Bilenko, ...
2008 IEEE International Reliability Physics Symposium, 441-445, 2008
112008
Reversible degradation of GaN LEDs related to passivation
M Meneghini, LR Trevisanello, R Penzo, M Benedetti, U Zehnder, ...
2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007
102007
Thermal degradation of InGaN/GaN LEDs ohmic contacts
M Meneghini, L Trevisanello, U Zehnder, G Meneghesso, E Zanoni
physica status solidi c 5 (6), 2250-2253, 2008
82008
Analysis of the temperature impact on reliability of GaN-based light emitting diodes
LR Trevisanello
62008
Analysis of diffusion involved in degradation of InGaN-based laser diodes
K Orita, S Takigawa, M Yuri, T Tanaka, M Meneghini, N Trivellin, ...
2009 IEEE International Reliability Physics Symposium, 736-740, 2009
52009
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