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- Alexander A. BalandinDistinguished Professor of Materials Science and Engineering, UCLAEmail verificata su seas.ucla.edu
- Rameez SamnakayUniversity of California, RiversideEmail verificata su ucr.edu
- Michael ShurPatricia W. and C. Sheldon Roberts Professor, Rensselaer PolytechnicEmail verificata su rpi.edu
- Jackie D. RenteriaPostdoctoral scholar in Electrical Engineering, UC-RiversideEmail verificata su ucr.edu
- Pradyumna GoliDirector, Global key accountsEmail verificata su henkel.com
- Guanxiong LiuUniversity of California RiversideEmail verificata su ee.ucr.edu
- Alexander KhitunUniversity of California RiversideEmail verificata su engr.ucr.edu
- Zhong Yan 严仲Nanjing University of Science and TechnologyEmail verificata su njust.edu.cn
- Maxim StolyarovKLAEmail verificata su ee.ucr.edu
- Denis L. Nika (Nica)Moldova State UniversityEmail verificata su usm.md
- MOJTABA RANJBARCarl Zeiss X-Ray Microscopy, IncEmail verificata su zeiss.com
- Sergey RumyantsevInstitute of High Pressure Physics
Segui
Chenglong Jiang
Staff Research Associate, University of California at Riverside
Email verificata su ucr.edu