| Deterministic switching of ferromagnetism at room temperature using an electric field JT Heron, JL Bosse, Q He, Y Gao, M Trassin, L Ye, JD Clarkson, C Wang, ... Nature 516 (7531), 370-373, 2014 | 728 | 2014 |
| Mapping the Photoresponse of CH3NH3PbI3 Hybrid Perovskite Thin Films at the Nanoscale Y Kutes, Y Zhou, JL Bosse, J Steffes, NP Padture, BD Huey Nano letters 16 (6), 3434-3441, 2016 | 144 | 2016 |
| Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies JL Bosse, PD Tovee, BD Huey, OV Kolosov Journal of Applied Physics 115 (14), 2014 | 37 | 2014 |
| Declamped piezoelectric coefficients in patterned 70/30 lead magnesium niobate–lead titanate thin films R Keech, L Ye, JL Bosse, G Esteves, J Guerrier, JL Jones, MA Kuroda, ... Advanced Functional Materials 27 (9), 1605014, 2017 | 36 | 2017 |
| Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution NA Polomoff, RN Premnath, JL Bosse, BD Huey Journal of materials science 44, 5189-5196, 2009 | 34 | 2009 |
| Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy JL Bosse, M Timofeeva, PD Tovee, BJ Robinson, BD Huey, OV Kolosov Journal of Applied Physics 116 (13), 2014 | 31 | 2014 |
| Nanosecond switching in GeSe phase change memory films by atomic force microscopy JL Bosse, I Grishin, Y Gyu Choi, B Cheong, S Lee, OV Kolosov, BD Huey Applied Physics Letters 104 (5), 2014 | 31 | 2014 |
| Mapping photovoltaic performance with nanoscale resolution Y Kutes, BA Aguirre, JL Bosse, JL Cruz‐Campa, D Zubia, BD Huey Progress in Photovoltaics: Research and Applications 24 (3), 315-325, 2016 | 29 | 2016 |
| Error-corrected AFM: A simple and broadly applicable approach for substantially improving AFM image accuracy JL Bosse, BD Huey Nanotechnology 25 (15), 155704, 2014 | 20 | 2014 |
| High speed friction microscopy and nanoscale friction coefficient mapping JL Bosse, S Lee, AS Andersen, DS Sutherland, BD Huey Measurement Science and Technology 25 (11), 115401, 2014 | 12 | 2014 |
| Nanomechanical morphology of amorphous, transition, and crystalline domains in phase change memory thin films JL Bosse, I Grishin, BD Huey, OV Kolosov Applied surface science 314, 151-157, 2014 | 12 | 2014 |
| Single ferroelectric domain nucleation and growth monitored by high speed piezoforce microscopy NA Polomoff, R Nath, JL Bosse, BD Huey Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 11 | 2009 |
| Multidimensional SPM applied for nanoscale conductance mapping JL Bosse, I Grishin, OV Kolosov, BD Huey Journal of Materials Research 28 (24), 3311-3321, 2013 | 10 | 2013 |
| Deterministic switching of Dzyaloshinskii-Moriya vector with electric field at room temperature JT Heron, JL Bosse, Q He, Y Gao, M Trassin, JD Clarkson, C Wang, J Liu, ... Nature 516, 370-373, 2014 | 3 | 2014 |
| Nanoscale photovoltaic performance in micro/nanopatterned CdTe-CdS thin film solar cells Y Kutes, JL Bosse, BA Aguirre, JL Cruz-Campa, J Michael, D Zubia, ... 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 1903-1907, 2014 | 2 | 2014 |
| High speed atomic force microscopy techniques for the efficient study of nanotribology JL Bosse | 2 | 2012 |
| High Speed SPM for Novel Property Mapping of Functional Ceramics V Vyas, V Palumbo, J Bosse, Y Kutes, L Ye, BD Huey Microscopy and Microanalysis 20 (S3), 1922-1923, 2014 | 1 | 2014 |
| Nanoscale Performance Mapping of Semiconducting Materials with Multiparametric Atomic Force Microscopy JL Bosse | | 2014 |
| High Speed SPM Investigations of Switching Dynamics in Solid State Memory Systems J Bosse, V Vyas, V Palumbo, I Grishin, OV Kolosov, BD Huey JSAP Annual Meetings Extended Abstracts The 74th JSAP Autumn Meeting 2013 …, 2013 | | 2013 |
| Nanometer/Nanosecond Resolved Domain Dynamics Allowing Mapping of Distinct Nucleation and Growth Activation Energies B Huey, N Polomoff, V Palumbo, J Bosse Bulletin of the American Physical Society 54, 2009 | | 2009 |
Yasemin KutesSr. Test R&D Engineer, Intel CorporationEmail verificata su intel.com
