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- John L. VolakisProfessor, Florida International UniversityEmail verificata su fiu.edu
- Chi-Chih ChenOhio State University Electrical and Comupter Engineering DepartmentEmail verificata su osu.edu
- John W. HalloranDepartment of Materials Science and Engineering, University of MichiganEmail verificata su umich.edu
- Stavros KoulouridisUniversity of Patras, Florida International UniversityEmail verificata su upatras.gr
- Bas, Umit CelalettinAppleEmail verificata su usc.edu
- Noboru KikuchiUniversity of Michigan, Toyota Central R&D LabsEmail verificata su umich.edu
- Safa Salmanohio state universityEmail verificata su osu.edu
- Zachary WingEmail verificata su acmtucson.com
- Farooq KhanExiumEmail verificata su exium.net
- Hongyu ZhouSamsung Research AmericaEmail verificata su samsung.com
- J. Brian FowlkesProfessor of Radiology and Biomedical Engineering, University of MichiganEmail verificata su umich.edu
- Paul L CarsonBRS Collegiate Professor of Radiology, University of MichiganEmail verificata su umich.edu
- Kubilay SertelAssociate Professor, Electrical and Computer Engineering, ElectroScience Laboratory, The Ohio StateEmail verificata su ece.osu.edu
- Ugur OlgunSnap IncEmail verificata su snap.com
- Behzad BiglarbegianUniversity of WaterlooEmail verificata su maxwell.uwaterloo.ca