Marco Barbato
TitoloCitata daAnno
Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis
M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014
Evolution of electrical parameters of dielectric-less ohmic RF-MEMS switches during continuous actuation stress
A Tazzoli, E Autizi, M Barbato, G Meneghesso, F Solazzi, P Farinelli, ...
2009 Proceedings of the European Solid State Device Research Conference, 343-346, 2009
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches
A Tazzoli, M Barbato, F Mattiuzzo, V Ritrovato, G Meneghesso
Microelectronics Reliability 50 (9-11), 1604-1608, 2010
Potential induced degradation of N-type bifacial silicon solar cells: An investigation based on electrical and optical measurements
M Barbato, A Barbato, M Meneghini, G Tavernaro, M Rossetto, ...
Solar Energy Materials and Solar Cells 168, 51-61, 2017
Characterization and modeling of organic (P3HT: PCBM) solar cells as a function of bias and illumination
A Rizzo, A Cester, N Wrachien, N Lago, L Torto, M Barbato, J Favaro, ...
Solar Energy Materials and Solar Cells 157, 337-345, 2016
Local shunting in multicrystalline silicon solar cells: distributed electrical simulations and experiments
D Giaffreda, P Magnone, M Meneghini, M Barbato, G Meneghesso, ...
IEEE Journal of Photovoltaics 4 (1), 40-47, 2013
A combined mechanical and electrical characterization procedure for investigating the dynamic behavior of RF-MEMS switches
M Barbato, V Giliberto, A Cester, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (1), 13-20, 2013
A physical-based equivalent circuit model for an organic/electrolyte interface
N Lago, A Cester, N Wrachien, M Natali, SD Quiroga, S Bonetti, ...
Organic Electronics 35, 176-185, 2016
Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation
M Barbato, M Meneghini, V Giliberto, D Giaffreda, P Magnone, R De Rose, ...
2012 38th IEEE Photovoltaic Specialists Conference, 001241-001245, 2012
Comparison of high efficiency flexible CdTe solar cells on different substrates at low temperature deposition
A Salavei, D Menossi, F Piccinelli, A Kumar, G Mariotto, M Barbato, ...
Solar Energy 139, 13-18, 2016
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells
A Cester, A Rizzo, A Bazzega, N Lago, J Favaro, M Barbato, N Wrachien, ...
Microelectronics Reliability 55 (9-10), 1795-1799, 2015
Field-and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level
I Rossetto, M Meneghini, E Canato, M Barbato, S Stoffels, N Posthuma, ...
Microelectronics Reliability 76, 298-303, 2017
Demonstration of field-and power-dependent ESD failure in AlGaN/GaN RF HEMTs
I Rossetto, M Meneghini, M Barbato, F Rampazzo, D Marcon, ...
IEEE Transactions on Electron Devices 62 (9), 2830-2836, 2015
A novel technique to alleviate the stiction phenomenon in radio frequency microelectromechanical switches
M Barbato, G Meneghesso
IEEE Electron Device Letters 36 (2), 177-179, 2014
A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches
M Barbato, V Giliberto, G Meneghesso
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2013
Preconditioning procedure for the better estimation of the long-term lifetime in microelectromechanical switches
M Barbato, A Cester, V Mulloni, B Margesin, G Meneghesso
IEEE Transactions on Electron Devices 63 (3), 1274-1280, 2016
Transient evolution of mechanical and electrical effects in microelectromechanical switches subjected to long-term stresses
M Barbato, A Cester, V Mulloni, B Margesin, G Meneghesso
IEEE Transactions on Electron Devices 62 (11), 3825-3831, 2015
Impact wear and other contact effects on the electro-mechanical reliability of MEMS
G De Pasquale, A Soma, M Barbato, G Meneghesso
2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS …, 2014
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
A Compagnin, M Meneghini, M Barbato, V Giliberto, A Cester, M Vanzi, ...
Microelectronics Reliability 53 (9-11), 1809-1813, 2013
Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation
G De Pasquale, M Barbato, V Giliberto, G Meneghesso, A Somà
Microelectronics Reliability 52 (9-10), 1808-1811, 2012
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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