| Accurate Operation Delay Prediction for FPGA HLS Using Graph Neural Networks E Ustun, C Deng, D Pal, Z Li, Z Zhang 39th International Conference on Computer-Aided Design, 2020 | 75 | 2020 |
| Can't see the forest for the trees: State restoration's limitations in post-silicon trace signal selection S Ma, D Pal, R Jiang, S Ray, S Vasudevan 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2015 | 49 | 2015 |
| Heteroflow: An accelerator programming model with decoupled data placement for software-defined fpgas S Xiang, YH Lai, Y Zhou, H Chen, N Zhang, D Pal, Z Zhang Proceedings of the 2022 ACM/SIGDA International Symposium on Field …, 2022 | 22 | 2022 |
| Assertion ranking using RTL source code analysis D Pal, S Offenberger, S Vasudevan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 11 | 2019 |
| Chassis: a platform for verifying PMU integration using autogenerated behavioral models A Ain, D Pal, P Dasgupta, S Mukhopadhyay, R Mukhopadhyay, J Gough ACM Transactions on Design Automation of Electronic Systems (TODAES) 16 (3 …, 2011 | 9 | 2011 |
| Symptomatic bug localization for functional debug of hardware designs D Pal, S Vasudevan 2016 29th International Conference on VLSI Design and 2016 15th …, 2016 | 8 | 2016 |
| Application level hardware tracing for scaling post-silicon debug D Pal, A Sharma, S Ray, FM De Paula, S Vasudevan Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 7 | 2018 |
| Using automatically generated invariants for regression testing and bug localization P Sagdeo, N Ewalt, D Pal, S Vasudevan 2013 28th IEEE/ACM International Conference on Automated Software …, 2013 | 7 | 2013 |
| Machine learning for agile fpga design D Pal, C Deng, E Ustun, C Yu, Z Zhang Machine Learning Applications in Electronic Design Automation, 471-504, 2022 | 4 | 2022 |
| GLAIVE: Graph Learning Assisted Instruction Vulnerability Estimation J Jiao, D Pal, C Deng, Z Zhang Design, Automation and Test in Europe Conference, 2021 | 4 | 2021 |
| Automated bug localization of software programs: A Survey Report D Pal, R Mohiuddin Technical report, Univerisity of Illinois at Urbana-Champaign, 2013 | 4 | 2013 |
| Emphasizing functional relevance over state restoration in post-silicon signal tracing D Pal, S Ma, S Vasudevan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 3 | 2018 |
| Accelerator design with decoupled hardware customizations: benefits and challenges D Pal, YH Lai, S Xiang, N Zhang, H Chen, J Casas, P Cocchini, Z Yang, ... Proceedings of the 59th ACM/IEEE Design Automation Conference, 1351-1354, 2022 | 2 | 2022 |
| Reconstrucción de pene luego de necrosis de glande por priapismo FG Gil, JA Benavides, A Lopera Revista Urología Colombiana/Colombian Urology Journal 28 (01), 076-079, 2019 | 2 | 2019 |
| A figure of merit for assertions in verification S Hertz, D Pal, S Offenberger, S Vasudevan Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 2 | 2019 |
| Formal Verification of Source-to-Source Transformations for HLS LN Pouchet, E Tucker, N Zhang, H Chen, D Pal, G Rodríguez, Z Zhang Proceedings of the 2024 ACM/SIGDA International Symposium on Field …, 2024 | 1 | 2024 |
| Prevalence of Brucella antibodies in milk and its public health significance1 SA Hussain, H Rahman, D Pal, K Ahmed Indian Journal of Comparative Microbiology, Immunology and Infectious …, 2009 | 1 | 2009 |
| Brucellosis in occupationally exposed persons. SA Hussain, H Rahman, D Pal | 1 | 2004 |
| Evaluation of serologic and delayed hypersensitivity test for detection of bovine brucellosis. SA Hussain, H Rahman, D Pal, NN Barman | 1 | 2003 |
| ARISTOTLE: Feature Engineering for Scalable Application-Level Post-Silicon Debugging D Pal, S Vasudevan IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | | 2024 |
Shobha VasudevanProfessor of Computer Engineering, University of Illinois at Urbana-ChampaignEmail verificata su illinois.edu
