| A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC D Appello, P Bernardi, G Giacopelli, A Motta, A Pagani, G Pollaccia, ... Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 23 | 2017 |
| Robustness in automotive electronics: An industrial overview of major concerns U Backhausen, O Ballan, P Bemardi, S De Luca, J Henzler, T Kern, ... 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 15 | 2017 |
| An optimized test during burn-in for automotive SoC D Appello, C Bugeja, G Pollaccia, P Bernardi, R Cantoro, M Restifo, ... IEEE Design & Test 35 (3), 46-53, 2018 | 13 | 2018 |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller P Bernardi, R Cantoro, L Gianotto, M Restifo, E Sánchez, F Venini, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 10 | 2017 |
| Evaluation of ISO 26262 and IEC 61508 metrics for transient faults of a multi-processor system-on-chip through radiation testing O Ballan, P Maillard, J Arver, C Smith, R Petersson, A Griessing, F Venini Microelectronics Reliability 107, 113601, 2020 | 9 | 2020 |
| Industrial best practice: cases of study by automotive chip-makers L Degli Abbati, R Ullmann, G Paganini, M Coppetta, L Zaia, V Huard, ... 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021 | 3 | 2021 |
| Improving stress quality for SoC using faster-than-at-speed execution of functional programs P Bernardi, A Bosio, G Di Natale, A Guerriero, E Sanchez, F Venini VLSI-SoC: System-on-Chip in the Nanoscale Era–Design, Verification and …, 2017 | 3 | 2017 |
| An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In D Appello, P Bernardi, C Bugeja, R Cantoro, A Colazzo, A Motta, ... Journal of Low Power Electronics 14 (1), 86-98, 2018 | 1 | 2018 |
| Faster-than-at-speed execution of functional programs: an experimental analysis P Bernardi, A Bosio, G Di Natale, A Guerriero, F Venini 2016 IFIP/IEEE International Conference on Very Large Scale Integration …, 2016 | 1 | 2016 |
| Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC D Appello, P Bernardi, C Bugeja, R Cantoro, G Pollaccia, M Restifo, ... Journal of Electronic Testing 34, 43-52, 2018 | | 2018 |
| An Optimized Test During Burn-In for Automotive SoC A Davide, B Paolo, B Conrad, C Riccardo, P Giorgio, R Marco, S Ernesto, ... IEEE DESIGN & TEST, 0 | | |
