Metrology of freeform shaped parts E Savio, L De Chiffre, R Schmitt CIRP annals 56 (2), 810-835, 2007 | 524 | 2007 |
On-machine and in-process surface metrology for precision manufacturing W Gao, H Haitjema, FZ Fang, RK Leach, CF Cheung, E Savio, JM Linares Cirp Annals 68 (2), 843-866, 2019 | 374 | 2019 |
Combination of a vision system and a coordinate measuring machine for the reverse engineering of freeform surfaces V Carbone, M Carocci, E Savio, G Sansoni, L De Chiffre The International Journal of Advanced Manufacturing Technology 17, 263-271, 2001 | 226 | 2001 |
Critical factors in SEM 3D stereo microscopy F Marinello, P Bariani, E Savio, A Horsewell, L De Chiffre Measurement Science and Technology 19 (6), 065705, 2008 | 138 | 2008 |
High-and very high-cycle plain fatigue resistance of shot peened high-strength aluminum alloys: The role of surface morphology M Benedetti, V Fontanari, M Bandini, E Savio International Journal of Fatigue 70, 451-462, 2015 | 110 | 2015 |
Investigating the technological limits of micro-injection molding in replicating high aspect ratio micro-structured surfaces G Lucchetta, M Sorgato, S Carmignato, E Savio CIRP Annals 63 (1), 521-524, 2014 | 102 | 2014 |
Testing of x-ray microtomography systems using a traceable geometrical standard S Carmignato, D Dreossi, L Mancini, F Marinello, G Tromba, E Savio Measurement Science and Technology 20 (8), 084021, 2009 | 99 | 2009 |
Economic benefits of metrology in manufacturing E Savio, L De Chiffre, S Carmignato, J Meinertz CIRP Annals 65 (1), 495-498, 2016 | 80 | 2016 |
Uncertainty evaluation of volumetric wear assessment from coordinate measurements of ceramic hip joint prostheses S Carmignato, M Spinelli, S Affatato, E Savio Wear 270 (9-10), 584-590, 2011 | 77 | 2011 |
Traceable volume measurements using coordinate measuring systems S Carmignato, E Savio CIRP annals 60 (1), 519-522, 2011 | 74 | 2011 |
Influence of surface roughness on computed tomography dimensional measurements S Carmignato, V Aloisi, F Medeossi, F Zanini, E Savio CIRP Annals 66 (1), 499-502, 2017 | 68 | 2017 |
An artefact for traceable freeform measurements on coordinate measuring machines E Savio, L De Chiffre Precision Engineering 26 (1), 58-68, 2002 | 66 | 2002 |
Metrological performance of optical coordinate measuring machines under industrial conditions S Carmignato, A Voltan, E Savio CIRP annals 59 (1), 497-500, 2010 | 62 | 2010 |
New advances in traceability of CMMs for almost the entire range of industrial dimensional metrology needs E Trapet, E Savio, L De Chiffre CIRP Annals 53 (1), 433-438, 2004 | 61 | 2004 |
Characterisation of additively manufactured metal surfaces by means of X-ray computed tomography and generalised surface texture parameters F Zanini, L Pagani, E Savio, S Carmignato CIRP annals 68 (1), 515-518, 2019 | 60 | 2019 |
CT for industrial metrology-accuracy and structural resolution of CT dimensional measurements S Carmignato, A Pierobon, P Rampazzo, M Parisatto, E Savio 4th conference on industrial computed tomography (iCT), 19-21, 2012 | 60 | 2012 |
Approaches to the calibration of freeform artefacts on coordinate measuring machines E Savio, HN Hansen, L De Chiffre CIRP Annals 51 (1), 433-436, 2002 | 54 | 2002 |
Fast technique for AFM vertical drift compensation F Marinello, P Bariani, L De Chiffre, E Savio Measurement Science and Technology 18 (3), 689, 2007 | 52 | 2007 |
Effects of different mould coatings on polymer filling flow in thin-wall injection moulding G Lucchetta, D Masato, M Sorgato, L Crema, E Savio CIRP Annals 65 (1), 537-540, 2016 | 50 | 2016 |
A methodology for the quantification of value-adding by manufacturing metrology E Savio CIRP annals 61 (1), 503-506, 2012 | 48 | 2012 |