Siva Narendra
Siva Narendra
Tyfone, Inc.
Email verificata su tyfone.com
Titolo
Citata da
Citata da
Anno
Parameter variations and impact on circuits and microarchitecture
S Borkar, T Karnik, S Narendra, J Tschanz, A Keshavarzi, V De
Proceedings of the 40th annual Design Automation Conference, 338-342, 2003
17132003
Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
JW Tschanz, JT Kao, SG Narendra, R Nair, DA Antoniadis, ...
IEEE Journal of Solid-State Circuits 37 (11), 1396-1402, 2002
8952002
Scaling of stack effect and its application for leakage reduction
S Narendra, V De, D Antoniadis, A Chandrakasan, S Borkar
Proceedings of the 2001 international symposium on Low power electronics andá…, 2001
4092001
A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package
P Hazucha, G Schrom, J Hahn, BA Bloechel, P Hack, GE Dermer, ...
IEEE Journal of Solid-State Circuits 40 (4), 838-845, 2005
3752005
Leakage in nanometer CMOS technologies
SG Narendra, AP Chandrakasan
Springer Science & Business Media, 2006
3722006
System and method for securing financial transactions
T Spitzer, P Tadepalli, S Narendra
US Patent App. 11/144,363, 2005
3712005
Dynamic sleep transistor and body bias for active leakage power control of microprocessors
JW Tschanz, SG Narendra, Y Ye, BA Bloechel, S Borkar, V De
IEEE Journal of Solid-State Circuits 38 (11), 1838-1845, 2003
3692003
Subthreshold leakage modeling and reduction techniques
J Kao, S Narendra, A Chandrakasan
Proceedings of the 2002 IEEE/ACM international conference on Computer-aidedá…, 2002
3322002
Comparative delay and energy of single edge-triggered & dual edge-triggered pulsed flip-flops for high-performance microprocessors
J Tschanz, S Narendra, Z Chen, S Borkar, M Sachdev, V De
Proceedings of the 2001 international symposium on Low power electronics andá…, 2001
3172001
Electronic transaction card
SG Narendra, TN Spitzer, P Tadepalli
US Patent 7,581,678, 2009
2672009
MTCMOS hierarchical sizing based on mutual exclusive discharge patterns
J Kao, S Narendra, A Chandrakasan
Proceedings of the 35th annual Design Automation Conference, 495-500, 1998
2561998
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs
A Keshavarzi, S Ma, S Narendra, B Bloechel, K Mistry, T Ghani, S Borkar, ...
Proceedings of the 2001 international symposium on Low power electronics andá…, 2001
2392001
Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging
J Tschanz, NS Kim, S Dighe, J Howard, G Ruhl, S Vangal, S Narendra, ...
2007 IEEE International Solid-State Circuits Conference. Digest of Technicalá…, 2007
2322007
Multiple well transistor circuits having forward body bias
VK De, A Keshavarzi, SG Narendra, SY Borkar
US Patent 6,218,895, 2001
2272001
Measurements and analysis of SER-tolerant latch in a 90-nm dual-V/sub T/CMOS process
P Hazucha, T Karnik, S Walstra, BA Bloechel, JW Tschanz, J Maiz, ...
IEEE Journal of Solid-State Circuits 39 (9), 1536-1543, 2004
2062004
Effectiveness of adaptive supply voltage and body bias for reducing impact of parameter variations in low power and high performance microprocessors
JW Tschanz, S Narendra, R Nair, V De
IEEE Journal of Solid-State Circuits 38 (5), 826-829, 2003
1862003
Full-chip subthreshold leakage power prediction and reduction techniques for sub-0.18-/spl mu/m CMOS
S Narendra, V De, S Borkar, DA Antoniadis, AP Chandrakasan
IEEE Journal of Solid-State Circuits 39 (3), 501-510, 2004
1812004
Low-voltage-swing monolithic dc-dc conversion
V Kursun, SG Narendra, VK De, EG Friedman
IEEE Transactions on Circuits and Systems II: Express Briefs 51 (5), 241-248, 2004
1592004
Forward body bias for microprocessors in 130-nm technology generation and beyond
S Narendra, A Keshavarzi, BA Bloechel, S Borkar, V De
IEEE Journal of Solid-State Circuits 38 (5), 696-701, 2003
1562003
Mobile phone with electronic transaction card
SG Narendra, P Tadepalli, TN Spitzer
US Patent 7,828,214, 2010
1462010
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
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