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Thomas Wilhein
Thomas Wilhein
RheinAhrCampus Remagen, HS Koblenz
Email verificata su rheinahrcampus.de
Titolo
Citata da
Citata da
Anno
Compact water‐window transmission X‐ray microscopy
Berglund, Rymell, Peuker, Wilhein, Hertz
Journal of microscopy 197 (3), 268-273, 2000
1872000
A new powerful source for coherent VUV radiation: Demonstration of exponential growth and saturation at the TTF free-electron laser
V Ayvazyan, N Baboi, I Bohnet, R Brinkmann, M Castellano, P Castro, ...
The European Physical Journal D-Atomic, Molecular, Optical and Plasma…, 2002
1802002
Investigation of soft X-ray emission from a gas puff target irradiated with a Nd: YAG laser
H Fiedorowicz, A Bartnik, M Szczurek, H Daido, N Sakaya, V Kmetik, ...
Optics Communications 163 (1-3), 103-114, 1999
1331999
Differential interference contrast X-ray microscopy with submicron resolution
T Wilhein, B Kaulich, E Di Fabrizio, F Romanato, S Cabrini, J Susini
Applied Physics Letters 78 (14), 2082-2084, 2001
1212001
Cryogenic liquid-jet target for debris-free laser-plasma soft x-ray generation
M Berglund, L Rymell, HM Hertz, T Wilhein
Review of scientific instruments 69 (6), 2361-2364, 1998
1111998
A slit grating spectrograph for quantitative soft x-ray spectroscopy
T Wilhein, S Rehbein, D Hambach, M Berglund, L Rymell, HM Hertz
Review of scientific instruments 70 (3), 1694-1699, 1999
1001999
TwinMic: a European twin X-ray microscopy station commissioned at ELETTRA
B Kaulich, D Bacescu, J Susini, C David, E Di Fabrizio, GR Morrison, ...
8th Int. Conf. X-ray Microscopy, 22-25, 2006
962006
Single-pulse resonant magnetic scattering using a soft x-ray free-electron laser
C Gutt, S Streit-Nierobisch, LM Stadler, B Pfau, CM Gnther, R Knnecke, ...
Physical Review B 81 (10), 100401, 2010
952010
Coherent imaging of biological samples with femtosecond pulses at the free-electron laser FLASH
AP Mancuso, T Gorniak, F Staier, OM Yefanov, R Barth, C Christophis, ...
New Journal of Physics 12 (3), 035003, 2010
922010
X-ray microscopy studies
G Schmahl, D Rudolph, B Niemann, P Guttmann, J Thieme, G Schneider
Optik (Stuttgart) 93 (3), 95-102, 1993
901993
Diffractive optical elements for differential interference contrast x-ray microscopy
E Di Fabrizio, D Cojoc, S Cabrini, B Kaulich, J Susini, P Facci, T Wilhein
Optics Express 11 (19), 2278-2288, 2003
832003
Differential interference contrast x-ray microscopy with twin zone plates
B Kaulich, T Wilhein, E Di Fabrizio, F Romanato, M Altissimo, S Cabrini, ...
JOSA A 19 (4), 797-806, 2002
822002
Compact soft x-ray microscope using a gas-discharge light source
M Benk, K Bergmann, D Schfer, T Wilhein
Optics letters 33 (20), 2359-2361, 2008
782008
Non-destructive analysis for the investigation of decomposition phenomena of historical manuscripts and prints
W Faubel, S Staub, R Simon, S Heissler, A Pataki, G Banik
Spectrochimica Acta Part B: Atomic Spectroscopy 62 (6-7), 669-676, 2007
722007
Off-axis reflection zone plate for quantitative soft x-ray source characterization
T Wilhein, D Hambach, B Niemann, M Berglund, L Rymell, HM Hertz
Applied physics letters 71 (2), 190-192, 1997
701997
Coherent-pulse 2D crystallography using a free-electron laser X-ray source
AP Mancuso, A Schropp, B Reime, LM Stadler, A Singer, J Gulden, ...
Physical review letters 102 (3), 035502, 2009
652009
Toward time-resolved soft X-ray microscopy using pulsed fs-high-harmonic radiation
M Wieland, C Spielmann, U Kleineberg, T Westerwalbesloh, ...
Ultramicroscopy 102 (2), 93-100, 2005
642005
Diagnostics of a laser-induced dense plasma by hydrogen-like carbon spectra
S Sorge, A Wierling, G Rpke, W Theobald, R Sauerbrey, T Wilhein
Journal of Physics B: Atomic, Molecular and Optical Physics 33 (16), 2983, 2000
612000
Resonant magnetic scattering with soft x-ray pulses from a free-electron laser operating at 1.59 nm
C Gutt, LM Stadler, S Streit-Nierobisch, AP Mancuso, A Schropp, B Pfau, ...
Physical Review B 79 (21), 212406, 2009
552009
EUV and fast ion emission from cryogenic liquid jet target laser-generated plasma
M Wieland, T Wilhein, M Faubel, C Ellert, M Schmidt, O Sublemontier
Applied Physics B 72, 591-597, 2001
532001
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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