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John A Notte
John A Notte
Chief Scientist, Carl Zeiss
Email verificata su zeiss.com
Titolo
Citata da
Citata da
Anno
Helium ion microscope: A new tool for nanoscale microscopy and metrology
BW Ward, JA Notte, NP Economou
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2006
5222006
Subsurface damage from helium ions as a function of dose, beam energy, and dose rate
R Livengood, S Tan, Y Greenzweig, J Notte, S McVey
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2009
2182009
An introduction to the helium ion microscope
J Morgan, J Notte, R Hill, B Ward
Microscopy today 14 (4), 24-31, 2006
2092006
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,554,096, 2009
972009
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,557,359, 2009
912009
Understanding imaging modes in the helium ion microscope
L Scipioni, CA Sanford, J Notte, B Thompson, S McVey
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2009
902009
The ALIS He ion source and its application to high resolution microscopy
R Hill, J Notte, B Ward
Physics Procedia 1 (1), 135-141, 2008
902008
Helium ion microscope
L Scipioni, LA Stern, J Notte, S Sijbrandij, B Griffin
Advanced Materials and Processes 166 (6), 27, 2008
842008
Neon ion beam lithography (NIBL)
D Winston, VR Manfrinato, SM Nicaise, LL Cheong, H Duan, D Ferranti, ...
Nano letters 11 (10), 4343-4347, 2011
832011
The effect of asymmetries on non‐neutral plasma confinement time
J Notte, J Fajans
Physics of plasmas 1 (5), 1123-1127, 1994
821994
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,554,097, 2009
802009
The prospects of a subnanometer focused neon ion beam
FHM Rahman, S McVey, L Farkas, JA Notte, S Tan, RH Livengood
Scanning 34 (2), 129-134, 2012
782012
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,557,358, 2009
782009
The history and development of the helium ion microscope
NP Economou, JA Notte, WB Thompson
Scanning 34 (2), 83-89, 2012
752012
An introduction to the helium ion microscope
J Notte, B Ward, N Economou, R Hill, R Percival, L Farkas, S McVey
AIP Conference proceedings 931 (1), 489-496, 2007
752007
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill, L Markwort, ...
US Patent 7,557,360, 2009
742009
An introduction to helium ion microscopy
J Notte, R Hill, S McVey, L Farkas, R Percival, B Ward
Microscopy and Microanalysis 12 (S02), 126-127, 2006
732006
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,557,361, 2009
722009
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill, A Groholski, ...
US Patent 7,786,451, 2010
712010
Ion sources, systems and methods
BW Ward, JA Notte IV, LS Farkas III, RG Percival, R Hill
US Patent 7,511,279, 2009
712009
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
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