Resistive Switching Nanodevices Based on Metal–Organic Frameworks Z Wang, D Nminibapiel, P Shrestha, J Liu, W Guo, PG Weidler, ...
ChemNanoMat 2 (1), 67-73, 2016
77 2016 Physical analysis of VO2 films grown by atomic layer deposition and RF magnetron sputtering M Tangirala, K Zhang, D Nminibapiel, V Pallem, C Dussarrat, W Cao, ...
ECS Journal of Solid State Science and Technology 3 (6), N89-N94, 2014
38 2014 Synthesis of VO2 Thin Films by Atomic Layer Deposition with TEMAV as Precursor K Zhang, M Tangirala, D Nminibapiel, W Cao, V Pallem, C Dussarrat, ...
ECS Transactions 50 (13), 175-182, 2013
38 2013 Characteristics of resistive memory read fluctuations in endurance cycling DM Nminibapiel, D Veksler, PR Shrestha, JH Kim, JP Campbell, JT Ryan, ...
IEEE Electron Device Letters 38 (3), 326-329, 2017
22 2017 ALD growth of PbTe and PbSe superlattices for thermoelectric applications K Zhang, ADR Pillai, D Nminibapiel, M Tangirala, VS Chakravadhanula, ...
ECS Transactions 58 (10), 131-139, 2013
22 2013 Analysis and Control of RRAM Overshoot Current PR Shrestha, DM Nminibapiel, JP Campbell, JT Ryan, D Veksler, ...
IEEE Transactions on Electron Devices 65 (1), 108-114, 2018
20 2018 Atomic layer deposition of nanolaminate structures of alternating PbTe and PbSe thermoelectric films K Zhang, ADR Pillai, K Bollenbach, D Nminibapiel, W Cao, H Baumgart, ...
ECS Journal of Solid State Science and Technology 3 (6), P207-P212, 2014
20 2014 Impact of RRAM read fluctuations on the program-verify approach DM Nminibapiel, D Veksler, PR Shrestha, JP Campbell, JT Ryan, ...
IEEE Electron Device Letters 38 (6), 736-739, 2017
19 2017 Growth of Nanolaminates of Thermoelectric Bi2Te3/Sb2Te3 by Atomic Layer Deposition D Nminibapiel, K Zhang, M Tangirala, H Baumgart, ...
ECS Journal of Solid State Science and Technology 3 (4), P95-P100, 2014
18 2014 Toward reliable RRAM performance: macro-and micro-analysis of operation processes G Bersuker, D Veksler, DM Nminibapiel, PR Shrestha, JP Campbell, ...
Journal of Computational Electronics 16 (4), 1085-1094, 2017
17 2017 Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN Resistive Random-Access Memory Studied via Electrically Detected Magnetic Resonance DJ McCrory, PM Lenahan, DM Nminibapiel, D Veksler, JT Ryan, ...
IEEE Transactions on Nuclear Science, 2018
14 2018 Energy control paradigm for compliance-free reliable operation of RRAM PR Shrestha, D Nminibapiel, JH Kim, JP Campbell, KP Cheung, S Deora, ...
Reliability Physics Symposium, 2014 IEEE International, MY. 10.1-MY. 10.4, 2014
12 2014 Dependence of the filament resistance on the duration of current overshoot P Shrestha, D Nminibapiel, JP Campbell, KP Cheung, H Baumgart, ...
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International …, 2013
10 2013 Fabrication of Sb2Te3 and Bi2Te3 multilayer composite films by Atomic Layer Deposition K Zhang, D Nminibapiel, M Tangirala, H Baumgart, V Kochergin
ECS Transactions 50 (13), 3-9, 2013
10 2013 Atomic layer deposition of antimony telluride thin films using (Me3Si) 2Te with SbCl3 as precursors D Gu, D Nminibapiel, H Baumgart, H Robinson, V Kochergin
ECS Transactions 41 (2), 255-261, 2011
10 2011 Atomic Layer Deposition of Antimony Telluride and Bismuth Telluride using (Me3Si) 2Te with SbCl3 and Trimethylbismuth as Precursors D Gu, D Nminibapiel, H Baumgart, H Robinson, V Kochergin
Meeting Abstracts, 1871-1871, 2011
10 * 2011 Synthesis and characterization of PbTe thin films by atomic layer deposition K Zhang, AD Pillai, M Tangirala, D Nminibapiel, K Bollenbach, W Cao, ...
physica status solidi (a) 211 (6), 1329-1333, 2014
8 2014 Rapid and Accurate JH Kim, PR Shrestha, JP Campbell, JT Ryan, D Nminibapiel, JJ Kopanski, ...
IEEE transactions on electron devices 63 (10), 3851-3856, 2016
7 2016 Pulsed IV on TFETs: Modeling and Measurements Q Smets, A Verhulst, JH Kim, JP Campbell, D Nminibapiel, D Veksler, ...
IEEE Transactions on Electron Devices 64 (4), 1489-1497, 2017
6 2017 Accurate RRAM transient currents during forming P Shrestha, D Nminibapiel, JP Campbell, JH Kim, C Vaz, KP Cheung, ...
VLSI Technology, Systems and Application (VLSI-TSA), Proceedings of …, 2014
6 2014 