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Co-authors
- Michael ClavelVirginia Polytechnic Institute and State UniversityVerified email at vt.edu
- Prof. Mantu HudaitAssoc. Prof. of ECE, Virginia Tech; Past: Intel Corporation, Ohio State U, IISc-Bangalore, IIT-KGPVerified email at vt.edu
- Karim HuetSCREEN Semiconductor Solutions Co., Ltd.Verified email at screen-lasse.com
- Maryam shayestehUniversity of SouthamptonVerified email at soton.ac.uk
- Dirch Hjorth PetersenSenior researcher at DTU Energy, Technical University of DenmarkVerified email at dtu.dk
- Fuccio CRISTIANOLAAS-CNRS Toulouse, FranceVerified email at laas.fr
- Patrick S. GoleyResearch and Development at PsiQuantumVerified email at psiquantum.com
- James C. GreerChair Professor in Engineering Physics, University of Nottingham, Ningbo, China campusVerified email at nottingham.edu.cn
- Giorgos FagasTyndall National InstituteVerified email at tyndall.ie
- Guillaume HuyetUniversité Côte d'Azur, CNRS, Institut de Physique de NiceVerified email at inphyni.cnrs.fr
- James S. Harris, Jr.Professor of Electrical Engineering, Stanford UniversityVerified email at stanford.edu
- Michael SchmidtElectron Microscopist, Tyndall National Institute, University College Cork, IrelandVerified email at tyndall.ie
- Martin P VaughanVisiting Fellow, University of EssexVerified email at essex.ac.uk
- Alessandro De MartinoCity, University of LondonVerified email at city.ac.uk
- Karen HallbergCentro Atomico Bariloche and Instituto Balseiro, ArgentinaVerified email at cab.cnea.gov.ar