Crea il mio profilo
Coautori
Michael ClavelVirginia Polytechnic Institute and State UniversityEmail verificata su vt.edu
Prof. Mantu HudaitAssociate Professor of Electrical and Computer Engineering, Virginia TechEmail verificata su vt.edu
Karim HuetSCREEN Semiconductor Solutions Co., Ltd.Email verificata su screen-lasse.com
Maryam shayestehUniversity of SouthamptonEmail verificata su soton.ac.uk
Dirch Hjorth PetersenSenior researcher in MEMS/NEMS, DTU Nanotech, Technical University of DenmarkEmail verificata su nanotech.dtu.dk
Fuccio CRISTIANOLAAS-CNRS Toulouse, FranceEmail verificata su laas.fr
James C. GreerLi Dak Sum Chair in Electronic Materials & Devices, University of Nottingham, Ningbo, China campusEmail verificata su nottingham.edu.cn
Giorgos FagasTyndall National InstituteEmail verificata su tyndall.ie
Guillaume HuyetUniversité Côte d'Azur, CNRS, Institut de Physique de NiceEmail verificata su inphyni.cnrs.fr
James S. Harris, Jr.Professor of Electrical Engineering, Stanford UniversityEmail verificata su stanford.edu
Michael SchmidtElectron Microscopist, Tyndall National Institute, University College Cork, IrelandEmail verificata su tyndall.ie
Martin P VaughanSenior Researcher Associate, University of BristolEmail verificata su bristol.ac.uk
Alessandro De MartinoCity, University of LondonEmail verificata su city.ac.uk
Karen HallbergCentro Atomico Bariloche and Instituto Balseiro, ArgentinaEmail verificata su cab.cnea.gov.ar
Patrick GoleyPhD Student at Georgia Institute of TechnologyEmail verificata su gatech.edu

Felipe Murphy Armando
Tyndall National Institute, Ireland
Email verificata su tyndall.ie