Effects of substrate temperature on copper (II) phthalocyanine thin films E Jungyoon, S Kim, E Lim, K Lee, D Cha, B Friedman
Applied Surface Science 205 (1-4), 274-279, 2003
146 2003 Scanning laser THz imaging system H Murakami, K Serita, Y Maekawa, S Fujiwara, E Matsuda, S Kim, ...
Journal of Physics D: Applied Physics 47 (37), 374007, 2014
61 2014 Enhanced coherence of all-nitride superconducting qubits epitaxially grown on silicon substrate S Kim, Hirotaka Terai, Taro Yamashita, ...
Communications Materials 2 (98), 1-7, 2021
56 2021 Transmission-type laser THz emission microscope using a solid immersion lens S Kim, H Murakami, M Tonouchi
IEEE Journal of Selected Topics in Quantum Electronics 14 (2), 498-504, 2008
48 2008 Study on electrical properties of CdS films prepared by chemical pyrolysis deposition D Cha, S Kim, NK Huang
Materials Science and Engineering: B 106 (1), 63-68, 2004
42 2004 Near-field radiative nanothermal imaging of nonuniform Joule heating in narrow metal wires Q Weng, KT Lin, K Yoshida, H Nema, S Komiyama, S Kim, K Hirakawa, ...
Nano Letters 18 (7), 4220-4225, 2018
38 2018 Backside observation of large-scale integrated circuits with multilayered interconnections using laser terahertz emission microscope M Yamashita, C Otani, K Kawase, T Matsumoto, K Nikawa, S Kim, ...
Applied Physics Letters 94 (19), 2009
38 2009 Fiske steps studied by flux-flow resistance oscillation in a narrow stack of junctions SM Kim, HB Wang, T Hatano, S Urayama, S Kawakami, M Nagao, ...
Physical Review B 72 (14), 140504, 2005
37 2005 Laser terahertz emission microscope H Murakami, N Uchida, R Inoue, S Kim, T Kiwa, M Tonouchi
Proceedings of the IEEE 95 (8), 1646-1657, 2007
36 2007 Terahertz oscillation in submicron sized intrinsic Josephson junctions HB Wang, S Urayama, SM Kim, S Arisawa, T Hatano, BY Zhu
Applied physics letters 89 (25), 2006
30 2006 π phase shifter based on NbN-based ferromagnetic Josephson junction on a silicon substrate T. Yamashita, S. Kim, H. Kato, W. Qiu, K. Semba, A. Fujimaki, H. Terai
Scientific reports 10, 13687, 2020
29 2020 Two-color detection with charge sensitive infrared phototransistors S Kim, S Komiyama, T Ueda, T Satoh, Y Kajihara
Applied Physics Letters 107 (18), 2015
27 2015 THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis M Yamashita, C Otani, T Matsumoto, Y Midoh, K Miura, K Nakamae, ...
Optics Express 19 (11), 10864-10873, 2011
27 2011 A high signal-to-noise ratio passive near-field microscope equipped with a helium-free cryostat KT Lin, S Komiyama, S Kim, K Kawamura, Y Kajihara
Review of Scientific Instruments 88 (1), 2017
24 2017 Nondestructive high spatial resolution imaging with a 60 GHz near-field scanning millimeter-wave microscope M Kim, J Kim, H Kim, S Kim, J Yang, H Yoo, S Kim, K Lee, B Friedman
Review of scientific instruments 75 (3), 684-688, 2004
24 2004 Periodic oscillations of Josephson-vortex flow resistance in oxygen-deficient M Nagao, S Urayama, SM Kim, HB Wang, KS Yun, Y Takano, T Hatano, ...
Physical Review B 74 (5), 054502, 2006
21 2006 Shapiro steps observed in annular intrinsic Josephson junctions at low microwave frequencies HB Wang, SM Kim, S Urayama, M Nagao, T Hatano, S Arisawa, ...
Applied physics letters 88 (6), 2006
19 2006 Laser THz emission microscope as a novel tool for LSI failure analysis M Yamashita, C Otani, S Kim, H Murakami, M Tonouchi, T Matsumoto, ...
Microelectronics Reliability 49 (9-11), 1116-1126, 2009
18 2009 Periodic oscillations, peak-splitting and phase transitions of Josephson vortex flow resistance in BY Zhu, HB Wang, SM Kim, S Urayama, T Hatano, X Hu
Physical Review B 72 (17), 174514, 2005
18 2005 Semiconductor inspection device and inspection method T Matsumoto, Y Aoki, M Tonouchi, H Murakami, S Kim, M Yamashita, ...
US Patent App. 13/061,363, 2011
17 2011