Segui
Peng Li
Peng Li
Associate Professor, Ph. D., Beijing University of Technology
Email verificata su bjut.edu.cn
Titolo
Citata da
Citata da
Anno
Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience
K Xu, W Sun, Y Shao, F Wei, X Zhang, W Wang, P Li
Nanotechnology Reviews 7 (6), 605-621, 2018
1052018
Phase modulation mode of scanning ion conductance microscopy
P Li, L Liu, Y Wang, Y Yang, C Zhang, G Li
Applied Physics Letters 105 (5), 2014
302014
In- Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy with Capacitance Compensation
P Li, L Liu, Y Yang, Y Wang, G Li
IEEE Transactions on Industrial Electronics, 2015
242015
Amplitude Modulation Mode of Scanning Ion Conductance Microscopy
P Li, L Liu, Y Yang, L Zhou, D Wang, Y Wang, G Li
Journal of laboratory automation,, 2015
152015
Development of mechanostimulated patch-clamp system for cellular physiological study
C Zhang, P Li, L Liu, Y Wang, Z Gao, G Li
Mechatronics, IEEE/ASME Transactions on 19 (4), 1138-1147, 2014
152014
Nanopatterning on calixarene thin films via low-energy field-emission scanning probe lithography
X He, X., Li, P., Zhang, X., Zhou, X., Liu, W., & Qiu
Nanotechnology, 2018
72018
Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire
G Zhang, P Li, D Wei, K Hu, X Qiu
Nanotechnology 31 (47), 475703, 2020
62020
Comprehensive indicators for evaluating and seeking elasto-magnetic parameters for high-performance cable force monitoring
S Yan, Y Wang, P Li, Z Gao, B Wu, X Liu
Sensors 22 (20), 7776, 2022
42022
Micromagnetic and quantitative prediction of surface hardness in carbon steels based on a joint classification-regression method
X Wang, C He, P Li, X Liu, Z Xing, Z Yan
Journal of Nondestructive Evaluation 41 (3), 62, 2022
42022
Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method
P Li, Y Shao, K Xu, X Qiu
Review of Scientific Instruments 92 (12), 2021
32021
Advances in scanning ion conductance microscopy: Principles and applications
P Li, G Li
IEEE Nanotechnology Magazine 15 (1), 17-25, 2020
22020
Quantitative characterization of tensile stress in electroplated nickel coatings with a magnetic incremental permeability sensor
N Wang, P Li, T Li, Y Wang, C He, X Liu
Sensors and Actuators A: Physical 368, 115082, 2024
12024
High-speed Atomic Force Microscope Technology: A Review
K Xu, Q An, P Li
Current Nanoscience 18 (5), 545-553, 2022
12022
Formation of Anti-Etching Nanopatterns in Field-Emission Scanning Probe Lithography on Calixarene Films
Y Wu, L Xu, Y Fan, Z Zhang, W Liu, P Li, X Qiu
The Journal of Physical Chemistry C 127 (26), 12593-12598, 2023
2023
High-speed multiparametric imaging through off-resonance tapping AFM with active probe
P Li, Y Shao, K Xu, X Liu
Ultramicroscopy 248, 113712, 2023
2023
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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