The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior TJ Yang, R Shivaraman, JS Speck, YR Wu Journal of Applied Physics 116 (11), 113104, 2014 | 127 | 2014 |
Analyzing the physical properties of InGaN multiple quantum well light emitting diodes from nano scale structure YR Wu, R Shivaraman, KC Wang, JS Speck Applied Physics Letters 101 (8), 083505, 2012 | 127 | 2012 |
Atom probe analysis of interfacial abruptness and clustering within a single quantum well device on semipolar GaN substrate TJ Prosa, PH Clifton, H Zhong, A Tyagi, R Shivaraman, SP DenBaars, ... Applied physics letters 98 (19), 191903, 2011 | 65 | 2011 |
Observation of columnar microstructure in lattice-matched InAlN/GaN grown by plasma assisted molecular beam epitaxy S Choi, F Wu, R Shivaraman, EC Young, JS Speck Applied Physics Letters 100 (23), 232102, 2012 | 52 | 2012 |
Observation of columnar microstructure in lattice-matched InAlN/GaN grown by plasma assisted molecular beam epitaxy S Choi, F Wu, R Shivaraman, EC Young, JS Speck Applied Physics Letters 100 (23), 232102, 2012 | 52 | 2012 |
Growth study and impurity characterization of AlxIn1− xN grown by metal organic chemical vapor deposition RB Chung, F Wu, R Shivaraman, S Keller, SP DenBaars, JS Speck, ... Journal of crystal growth 324 (1), 163-167, 2011 | 49 | 2011 |
Comparative analysis of and semipolar GaN light emitting diodes using atom probe tomography R Shivaraman, Y Kawaguchi, S Tanaka, SP DenBaars, S Nakamura, ... Applied Physics Letters 102 (25), 251104, 2013 | 35 | 2013 |
Contribution of alloy clustering to limiting the two-dimensional electron gas mobility in AlGaN/GaN and InAlN/GaN heterostructures: Theory and experiment E Ahmadi, H Chalabi, SW Kaun, R Shivaraman, JS Speck, UK Mishra Journal of Applied Physics 116 (13), 133702, 2014 | 25 | 2014 |
Elimination of columnar microstructure in N-face InAlN, lattice-matched to GaN, grown by plasma-assisted molecular beam epitaxy in the N-rich regime E Ahmadi, R Shivaraman, F Wu, S Wienecke, SW Kaun, S Keller, ... Applied Physics Letters 104 (7), 072107, 2014 | 25 | 2014 |
Pre-sharpened microtips: An efficient sample preparation method for atom probe tomography R Shivaraman, R Ulfig, DJ Larson, H Fukuzawa, DC Bell, H Wang, ... Microscopy and Microanalysis 15 (S2), 296, 2009 | 4 | 2009 |
Atom probe tomography of iii-Nitrides R Shivaraman University of California, Santa Barbara, 2013 | 2 | 2013 |
Strucuture of Low Loss EELS in Hf and Zr Metal, Dioxides and Silicates R Shivaraman, AVG Chizmeshya, SK Dey, RW Carpenter Microscopy and Microanalysis 14 (S2), 14, 2008 | 1 | 2008 |
Atom Probe Tomography of III-Nitrides Based Semiconducting Devices R Shivaraman, YR Wu, S Choi, R Chung, J Speck Microscopy and Microanalysis 19 (S2), 956-957, 2013 | | 2013 |
Deposition of NiTi shape memory effect thin films by laser ablation and their characterization V Student, R Shivaraman | | |