| Near‐field optical‐scanning microscopy U Dürig, DW Pohl, F Rohner Journal of applied physics 59 (10), 3318-3327, 1986 | 1018 | 1986 |
| Nanoindentation of polymers: an overview MR VanLandingham, JS Villarrubia, WF Guthrie, GF Meyers Macromolecular symposia 167 (1), 15-44, 2001 | 543 | 2001 |
| Mechanical deformation of atomic-scale metallic contacts: structure and mechanisms MR Sørensen, M Brandbyge, KW Jacobsen Physical Review B 57 (6), 3283, 1998 | 328 | 1998 |
| Nanoscale three-dimensional patterning of molecular resists by scanning probes D Pires, JL Hedrick, A De Silva, J Frommer, B Gotsmann, H Wolf, ... Science 328 (5979), 732-735, 2010 | 320 | 2010 |
| Millipede-a MEMS-based scanning-probe data-storage system E Eleftheriou, T Antonakopoulos, GK Binnig, G Cherubini, M Despont, ... IEEE transactions on magnetics 39 (2), 938-945, 2003 | 311 | 2003 |
| Experimental observation of forces acting during scanning tunneling microscopy U Dürig, JK Gimzewski, DW Pohl Physical review letters 57 (19), 2403, 1986 | 288 | 1986 |
| Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy U Dürig Applied Physics Letters 75 (3), 433-435, 1999 | 241 | 1999 |
| Atomic force microscope cantilevers for combined thermomechanical data writing and reading WP King, TW Kenny, KE Goodson, G Cross, M Despont, U Dürig, ... Applied Physics Letters 78 (9), 1300-1302, 2001 | 235 | 2001 |
| Ultrahigh density, high-data-rate NEMS-based AFM data storage system P Vettiger, J Brugger, M Despont, U Drechsler, U Dürig, W Häberle, ... Microelectronic Engineering 46 (1-4), 11-17, 1999 | 226 | 1999 |
| Interaction force detection in scanning probe microscopy: Methods and applications U Dürig, O Züger, A Stalder Journal of Applied Physics 72 (5), 1778-1798, 1992 | 201 | 1992 |
| VLSI-NEMS chip for parallel AFM data storage M Despont, J Brugger, U Drechsler, U Dürig, W Häberle, M Lutwyche, ... Sensors and Actuators A: Physical 80 (2), 100-107, 2000 | 196 | 2000 |
| Physics of sliding friction BNJ Persson, E Tosatti Springer Science & Business Media, 2013 | 190 | 2013 |
| Jellium model of metallic nanocohesion CA Stafford, D Baeriswyl, J Bürki Physical review letters 79 (15), 2863, 1997 | 178 | 1997 |
| Observation of metallic adhesion using the scanning tunneling microscope U Dürig, O Züger, DW Pohl Physical review letters 65 (3), 349, 1990 | 176 | 1990 |
| Dynamic force microscopy by means of the phase-controlled oscillator method U Dürig, HR Steinauer, N Blanc Journal of applied physics 82 (8), 3641-3651, 1997 | 175 | 1997 |
| YfiBNR mediates cyclic di-GMP dependent small colony variant formation and persistence in Pseudomonas aeruginosa JG Malone, T Jaeger, C Spangler, D Ritz, A Spang, C Arrieumerlou, ... PLoS Pathog 6 (3), e1000804, 2010 | 174 | 2010 |
| Effect of low numerical-aperture femtosecond two-photon absorption on (SU-8) resist for ultrahigh-aspect-ratio microstereolithography WH Teh, U Dürig, U Drechsler, CG Smith, HJ Güntherodt Journal of applied physics 97 (5), 054907, 2005 | 173 | 2005 |
| Design of atomic force microscope cantilevers for combined thermomechanical writing and thermal reading in array operation WP King, TW Kenny, KE Goodson, GLW Cross, M Despont, UT Durig, ... Journal of Microelectromechanical Systems 11 (6), 765-774, 2002 | 168 | 2002 |
| Probe‐based 3‐D nanolithography using self‐amplified depolymerization polymers AW Knoll, D Pires, O Coulembier, P Dubois, JL Hedrick, J Frommer, ... Advanced Materials 22 (31), 3361-3365, 2010 | 163 | 2010 |
| Scanning force microscopy in the dynamic mode using microfabricated capacitive sensors N Blanc, J Brugger, NF De Rooij, U Dürig Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996 | 162 | 1996 |
