Urs Dürig
Urs Dürig
Unknown affiliation
Verified email at swisslitho.com
Cited by
Cited by
Near‐field optical‐scanning microscopy
U Dürig, DW Pohl, F Rohner
Journal of applied physics 59 (10), 3318-3327, 1986
Nanoindentation of polymers: an overview
MR VanLandingham, JS Villarrubia, WF Guthrie, GF Meyers
Macromolecular symposia 167 (1), 15-44, 2001
Mechanical deformation of atomic-scale metallic contacts: structure and mechanisms
MR Sørensen, M Brandbyge, KW Jacobsen
Physical Review B 57 (6), 3283, 1998
Nanoscale three-dimensional patterning of molecular resists by scanning probes
D Pires, JL Hedrick, A De Silva, J Frommer, B Gotsmann, H Wolf, ...
Science 328 (5979), 732-735, 2010
Millipede-a MEMS-based scanning-probe data-storage system
E Eleftheriou, T Antonakopoulos, GK Binnig, G Cherubini, M Despont, ...
IEEE transactions on magnetics 39 (2), 938-945, 2003
Experimental observation of forces acting during scanning tunneling microscopy
U Dürig, JK Gimzewski, DW Pohl
Physical review letters 57 (19), 2403, 1986
Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy
U Dürig
Applied Physics Letters 75 (3), 433-435, 1999
Atomic force microscope cantilevers for combined thermomechanical data writing and reading
WP King, TW Kenny, KE Goodson, G Cross, M Despont, U Dürig, ...
Applied Physics Letters 78 (9), 1300-1302, 2001
Ultrahigh density, high-data-rate NEMS-based AFM data storage system
P Vettiger, J Brugger, M Despont, U Drechsler, U Dürig, W Häberle, ...
Microelectronic Engineering 46 (1-4), 11-17, 1999
Interaction force detection in scanning probe microscopy: Methods and applications
U Dürig, O Züger, A Stalder
Journal of Applied Physics 72 (5), 1778-1798, 1992
VLSI-NEMS chip for parallel AFM data storage
M Despont, J Brugger, U Drechsler, U Dürig, W Häberle, M Lutwyche, ...
Sensors and Actuators A: Physical 80 (2), 100-107, 2000
Physics of sliding friction
BNJ Persson, E Tosatti
Springer Science & Business Media, 2013
Jellium model of metallic nanocohesion
CA Stafford, D Baeriswyl, J Bürki
Physical review letters 79 (15), 2863, 1997
Observation of metallic adhesion using the scanning tunneling microscope
U Dürig, O Züger, DW Pohl
Physical review letters 65 (3), 349, 1990
Dynamic force microscopy by means of the phase-controlled oscillator method
U Dürig, HR Steinauer, N Blanc
Journal of applied physics 82 (8), 3641-3651, 1997
YfiBNR mediates cyclic di-GMP dependent small colony variant formation and persistence in Pseudomonas aeruginosa
JG Malone, T Jaeger, C Spangler, D Ritz, A Spang, C Arrieumerlou, ...
PLoS Pathog 6 (3), e1000804, 2010
Effect of low numerical-aperture femtosecond two-photon absorption on (SU-8) resist for ultrahigh-aspect-ratio microstereolithography
WH Teh, U Dürig, U Drechsler, CG Smith, HJ Güntherodt
Journal of applied physics 97 (5), 054907, 2005
Design of atomic force microscope cantilevers for combined thermomechanical writing and thermal reading in array operation
WP King, TW Kenny, KE Goodson, GLW Cross, M Despont, UT Durig, ...
Journal of Microelectromechanical Systems 11 (6), 765-774, 2002
Probe‐based 3‐D nanolithography using self‐amplified depolymerization polymers
AW Knoll, D Pires, O Coulembier, P Dubois, JL Hedrick, J Frommer, ...
Advanced Materials 22 (31), 3361-3365, 2010
Scanning force microscopy in the dynamic mode using microfabricated capacitive sensors
N Blanc, J Brugger, NF De Rooij, U Dürig
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
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