Ye Zuochang
Ye Zuochang
Institute of Microelectronics, Tsinghua University
Verified email at tsinghua.edu.cn
TitleCited byYear
Responses of rape genotypes to boron application
Y Yuai, X Jianming, Y Zhengqiang, W Ke
Plant Nutrition—from Genetic Engineering to Field Practice, 421-424, 1993
421993
Generalized Krylov recycling methods for solution of multiple related linear equation systems in electromagnetic analysis
Z Ye, Z Zhu, JR Phillips
Proceedings of the 45th annual Design Automation Conference, 682-687, 2008
352008
Sparse implicit projection (SIP) for reduction of general many-terminal networks
Z Ye, D Vasilyev, Z Zhu, JR Phillips
2008 IEEE/ACM International Conference on Computer-Aided Design, 736-743, 2008
332008
Fast floating random walk algorithm for multi-dielectric capacitance extraction with numerical characterization of Green’s functions
H Zhuang, W Yu, G Hu, Z Liu, Z Ye
Proceedings of the Asia South Pacific design automation conference (ASP-DAC …, 2012
262012
Efficient statistical capacitance extraction of nanometer interconnects considering the on-chip line edge roughness
W Yu, Q Zhang, Z Ye, Z Luo
Microelectronics Reliability 52 (4), 704-710, 2012
222012
A Low Power Inductorless Wideband LNA With Gm Enhancement and Noise Cancellation
Z Pan, C Qin, Z Ye, Y Wang
IEEE microwave and wireless components letters 27 (1), 58-60, 2016
202016
Layout-dependent STI stress analysis and stress-aware RF/analog circuit design optimization
J Xue, Z Ye, Y Deng, H Wang, L Yang, Z Yu
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
202009
A framework for layout-dependent STI stress analysis and stress-aware circuit optimization
J Xue, Y Deng, Z Ye, H Wang, L Yang, Z Yu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (3), 498-511, 2011
182011
Wideband Inductorless Low-Power LNAs with Gm Enhancement and Noise-Cancellation
Z Pan, C Qin, Z Ye, Y Wang, Z Yu
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 26-38, 2017
172017
Co-design of 60-GHz wideband front-end IC with on-chip T/R switch based on passive macro-modeling
L Kuang, B Chi, H Jia, Z Ye, W Jia, Z Wang
IEEE Transactions on Microwave Theory and Techniques 62 (11), 2743-2754, 2014
162014
An efficient algorithm for modeling spatially-correlated process variation in statistical full-chip leakage analysis
Z Ye, Z Yu
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
162009
Efficient extraction of frequency-dependent substrate parasitics using direct boundary element method
W Yu, X Wang, Z Ye, Z Wang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
162008
Efficient 3-d capacitance extraction considering lossy substrate with multilayered green's function
Z Ye, W Yu, Z Yu
IEEE transactions on microwave theory and techniques 54 (5), 2128-2137, 2006
162006
Statistical analysis of soft error rate in digital logic design including process variations
J Yao, Z Ye, M Li, Y Li, RD Schrimpf, DM Fleetwood, Y Wang
IEEE Transactions on Nuclear Science 59 (6), 2811-2817, 2012
152012
Importance boundary sampling for SRAM yield analysis with multiple failure regions
J Yao, Z Ye, Y Wang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
142014
Robust passive macro-model generation with local compensation
T Wang, Z Ye
IEEE Transactions on Microwave Theory and Techniques 60 (8), 2313-2328, 2012
142012
Fast and reliable passivity assessment and enforcement with extended Hamiltonian pencil
Z Ye, LM Silveira, JR Phillips
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
142009
Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling
J Yao, Z Ye, Y Wang
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
132013
A novel framework for passive macro-modeling
Z Ye, Y Li, M Gao, Z Yu
Proceedings of the 48th Design Automation Conference, 546-551, 2011
122011
A comprehensive model for gate delay under process variation and different driving and loading conditions
M Gao, Z Ye, Y Peng, Y Wang, Z Yu
2010 11th International Symposium on Quality Electronic Design (ISQED), 406-412, 2010
122010
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Articles 1–20