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Gregg Jessen
Gregg Jessen
MACOM
Email verificata su macom.com
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Citata da
Citata da
Anno
Guest Editorial: The dawn of gallium oxide microelectronics
M Higashiwaki, GH Jessen
Applied Physics Letters 112 (6), 2018
6132018
3.8-MV/cm Breakdown Strength of MOVPE-Grown Sn-Doped-Ga2O3MOSFETs
AJ Green, KD Chabak, ER Heller, RC Fitch, M Baldini, A Fiedler, ...
IEEE Electron Device Letters 37 (7), 902-905, 2016
5842016
Short-channel effect limitations on high-frequency operation of AlGaN/GaN HEMTs for T-gate devices
GH Jessen, RC Fitch, JK Gillespie, G Via, A Crespo, D Langley, ...
IEEE Transactions on Electron Devices 54 (10), 2589-2597, 2007
3992007
Enhancement-mode Ga2O3 wrap-gate fin field-effect transistors on native (100) β-Ga2O3 substrate with high breakdown voltage
KD Chabak, N Moser, AJ Green, DE Walker, SE Tetlak, E Heller, ...
Applied Physics Letters 109 (21), 2016
3742016
Demonstration of high mobility and quantum transport in modulation-doped β-(AlxGa1-x) 2O3/Ga2O3 heterostructures
Y Zhang, A Neal, Z Xia, C Joishi, JM Johnson, Y Zheng, S Bajaj, ...
Applied Physics Letters 112 (17), 2018
3562018
-Ga2O3 MOSFETs for Radio Frequency Operation
AJ Green, KD Chabak, M Baldini, N Moser, R Gilbert, RC Fitch, G Wagner, ...
IEEE Electron Device Letters 38 (6), 790-793, 2017
3022017
Dominant effect of near-interface native point defects on ZnO Schottky barriers
LJ Brillson, HL Mosbacker, MJ Hetzer, Y Strzhemechny, GH Jessen, ...
Applied Physics Letters 90 (10), 2007
2762007
Donors and deep acceptors in β-Ga2O3
AT Neal, S Mou, S Rafique, H Zhao, E Ahmadi, JS Speck, KT Stevens, ...
Applied Physics Letters 113 (6), 2018
2582018
Recessed-Gate Enhancement-Mode -Ga2O3 MOSFETs
KD Chabak, JP McCandless, NA Moser, AJ Green, K Mahalingam, ...
IEEE Electron device letters 39 (1), 67-70, 2017
2222017
Ge-Doped -Ga2O3 MOSFETs
N Moser, J McCandless, A Crespo, K Leedy, A Green, A Neal, S Mou, ...
IEEE Electron Device Letters 38 (6), 775-778, 2017
1972017
Observation of 4H–SiC to 3C–SiC polytypic transformation during oxidation
RS Okojie, M Xhang, P Pirouz, S Tumakha, G Jessen, LJ Brillson
Applied Physics Letters 79 (19), 3056-3058, 2001
1922001
Highly conductive homoepitaxial Si-doped Ga2O3 films on (010) β-Ga2O3 by pulsed laser deposition
KD Leedy, KD Chabak, V Vasilyev, DC Look, JJ Boeckl, JL Brown, ...
Applied Physics Letters 111 (1), 2017
1792017
Lateral β-Ga2O3 field effect transistors
KD Chabak, KD Leedy, AJ Green, S Mou, AT Neal, T Asel, ER Heller, ...
Semiconductor Science and Technology 35 (1), 013002, 2019
1232019
High-power Ka-band performance of AlInN/GaN HEMT with 9.8-nm-thin barrier
A Crespo, MM Bellot, KD Chabak, JK Gillespie, GH Jessen, V Miller, ...
IEEE Electron Device Letters 31 (1), 2-4, 2009
1222009
Incomplete Ionization of a 110 meV Unintentional Donor in β-Ga2O3 and its Effect on Power Devices
AT Neal, S Mou, R Lopez, JV Li, DB Thomson, KD Chabak, GH Jessen
Scientific reports 7 (1), 13218, 2017
1172017
Full-wafer characterization of AlGaN/GaN HEMTs on free-standing CVD diamond substrates
KD Chabak, JK Gillespie, V Miller, A Crespo, J Roussos, M Trejo, ...
IEEE electron device letters 31 (2), 99-101, 2009
962009
High pulsed current density β-Ga2O3 MOSFETs verified by an analytical model corrected for interface charge
NA Moser, JP McCandless, A Crespo, KD Leedy, AJ Green, ER Heller, ...
Applied Physics Letters 110 (14), 2017
902017
Comparison of gate and drain current detection of hydrogen at room temperature with AlGaN∕ GaN high electron mobility transistors
HT Wang, BS Kang, F Ren, RC Fitch, JK Gillespie, N Moser, G Jessen, ...
Applied Physics Letters 87 (17), 2005
842005
ScAlN/GaN high-electron-mobility transistors with 2.4-A/mm current density and 0.67-S/mm transconductance
AJ Green, JK Gillespie, RC Fitch, DE Walker, M Lindquist, A Crespo, ...
IEEE Electron Device Letters 40 (7), 1056-1059, 2019
772019
Implementation of High-Power-Density-Band AlGaN/GaN High Electron Mobility Transistors in a Millimeter-Wave Monolithic Microwave Integrated Circuit Process
RC Fitch, DE Walker, AJ Green, SE Tetlak, JK Gillespie, RD Gilbert, ...
IEEE electron device letters 36 (10), 1004-1007, 2015
682015
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