Crea il mio profilo
Accesso pubblico
Visualizza tutto59 articoli
11 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
- James L BosseUniversity of ConnecticutEmail verificata su uconn.edu
- R. RAMESHUniversity of California, BerkeleyEmail verificata su berkeley.edu
- Yasemin KutesSr. Test R&D Engineer, Intel CorporationEmail verificata su intel.com
- Linghan YeBruker Corp.Email verificata su uconn.edu
- Darrell G. SchlomCornell UniversityEmail verificata su cornell.edu
- Oleg KolosovProfessor of Nanoscience, Physics Department, Lancaster University, UKEmail verificata su lancaster.ac.uk
- Nitin P. PadtureOtis E. Randall University Professor, Brown UniversityEmail verificata su brown.edu
- Jorge Íñiguez-GonzálezLuxembourg Institute of Science and Technology (LIST)Email verificata su list.lu
- Yuanyuan ZhouThe Hong Kong University of Science and Technology (HKUST)Email verificata su ust.hk
- Varun VyasBennett University, IndiaEmail verificata su bennett.edu.in
- Roger H. FrenchKyocera Professor, Case Western Reserve University, Case School of Engineering, Materials ScienceEmail verificata su case.edu
- Morgan TrassinProfessor at Materials Department ETH ZurichEmail verificata su mat.ethz.ch
- Kristopher O. DavisUniversity of Central FloridaEmail verificata su ucf.edu
- Jeffrey R. McCutcheonUniversity of ConnecticutEmail verificata su engr.uconn.edu
- John HeronUniversity of MichiganEmail verificata su umich.edu
- Justin LuriaSr. Electrical Engineer, RaytheonEmail verificata su raytheon.com
- Jon IhlefeldUniversity of VirginiaEmail verificata su virginia.edu
- Andrzej J KulikEPFL SwitzerlandEmail verificata su epfl.ch
- Robert SzoszkiewiczUniversity of WarsawEmail verificata su chem.uw.edu.pl
- John BlendellPurdue UniversityEmail verificata su purdue.edu