| Dynamics of dust dispersion from the layer behind the propagating shock wave R Klemens, P Zydak, M Kaluzny, D Litwin, P Wolanski Journal of Loss Prevention in the Process Industries 19 (2-3), 200-209, 2006 | 60 | 2006 |
| An ellipsoidal mirror for focusing neutral atomic and molecular beams K Fladischer, H Reingruber, T Reisinger, V Mayrhofer, WE Ernst, AE Ross, ... New journal of Physics 12 (3), 033018, 2010 | 40 | 2010 |
| Measurements of the geometrical characteristics of the silicon wafer for helium microscope focusing mirror D Litwin, J Galas, T Kozlowski, S Sitarek Photonics Applications in Industry and Research IV 5948, 177-184, 2005 | 19 | 2005 |
| An optical profilometer for characterizing complex surfaces under high vacuum conditions K Fladischer, D Litwin, J Galas, AE Weeks, DA MacLaren, R Lammegger, ... Precision engineering 32 (3), 182-185, 2008 | 17 | 2008 |
| Accurate surface profilometry of ultrathin wafers AE Weeks, D Litwin, J Galas, B Surma, B Piatkowski, DA MacLaren, ... Semiconductor science and technology 22 (9), 997, 2007 | 16 | 2007 |
| X-ray studies of ultra-thin Si wafers for mirror application J Sass, K Mazur, B Surma, F Eichhorn, D Litwin, J Galas, S Sitarek Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 16 | 2006 |
| Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres AM Sadik, WA Ramadan, D Litwin Measurement Science and Technology 14 (10), 1753, 2003 | 16 | 2003 |
| Liquid phase epitaxial growth and characterization of Nd: YAG/YAG structures for thin-film lasers J Sarnecki, M Malinowski, J Skwarcz, R Jablonski, K Mazur, D Litwin, ... Laser Technology VI: Progress in Lasers 4237, 5-10, 2000 | 15 | 2000 |
| Interferometric and confocal techniques for testing of silicon wafers J Galas, D Litwin, S Sitarek, B Surma, B Piatkowski, A Miros Optical Micro-and Nanometrology in Microsystems Technology 6188, 84-91, 2006 | 14 | 2006 |
| Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers D Litwin, AM Sadik Optica Applicata 28, 139-154, 1998 | 14 | 1998 |
| Performance analysis of thermally bonded Er3+, Yb3+:glass/Co2+:MgAl2O4 microchip lasers J Mlynczak, N Belghachem, K Kopczynski, J Kisielewski, R Stepien, ... Optical and Quantum Electronics 48, 1-10, 2016 | 11 | 2016 |
| Temperature influence in confocal techniques for a silicon wafer testing D Litwin, J Galas, S Sitarek, B Surma, B Piatkowski, A Miros Optical Sensing Technology and Applications 6585, 247-254, 2007 | 10 | 2007 |
| Automated variable wavelength interferometry in reflected light mode D Litwin, J Galas, N Blocki Optical Micro-and Nanometrology in Microsystems Technology 6188, 112-119, 2006 | 10 | 2006 |
| Interferometric and fourier techniques for measurements of optical properties of fibers D Litwin, AM Sadik Molecular Crystals and Liquid Crystals Science and Technology. Section A …, 2000 | 7 | 2000 |
| Fringe image analysis for variable wavelength interferometry J Galas, S Sitarek, D Litwin, M Daszkiewicz Photonics Applications in Astronomy, Communications, Industry, and High …, 2017 | 6 | 2017 |
| New approach for identifying the zero-order fringe in variable wavelength interferometry J Galas, D Litwin, M Daszkiewicz 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of …, 2016 | 5 | 2016 |
| Pulse laser head with monolithic thermally bonded microchip operating at 1.5 µm wavelength J Młyńczak, K Kopczyński, N Belghachem, J Kisielewski, R Stępień, ... Laser Technology 2016: Progress and Applications of Lasers 10159, 35-40, 2016 | 5 | 2016 |
| Profilometr laserowy do odtwarzania geometrii powierzchni P Czajka, W Mizak, J Galas, A Czyżewski, M Kochanowski, D Litwin, ... Przegląd Elektrotechniczny 8, 152-156, 2014 | 5 | 2014 |
| Mechanism of dust dispersing from the layer by propagating shock wave in the flow without obstacles R Klemens, P Zydak, M Kaluzny, D Litwin, P Wolanski Proc. of the 5th International Symposium on Hazards, Prevention and …, 2004 | 5 | 2004 |
| Measurement of birefringence of textile fibers based on the analysis of the interference pattern in the backfocal plane of the microscope objective D Litwin, AM Sadik Laser Interferometry IX: Applications 3479, 160-169, 1998 | 5 | 1998 |
Donald A MacLarenProfessor of Materials Physics at the University of GlasgowEmail verificata su glasgow.ac.uk
