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Seung Heon Shin
Seung Heon Shin
Korea Polytechnics
Email verificata su kopo.ac.kr
Titolo
Citata da
Citata da
Anno
Radio Frequency Transistors and Circuits Based on CVD MoS2
A Sanne, R Ghosh, A Rai, MN Yogeesh, SH Shin, A Sharma, K Jarvis, ...
Nano letters 15 (8), 5039-5045, 2015
1922015
Extremely high-frequency flexible graphene thin-film transistors
S Park, SH Shin, MN Yogeesh, AL Lee, S Rahimi, D Akinwande
IEEE Electron Device Letters 37 (4), 512-515, 2016
652016
Sub-100 nm InGaAs quantum-well (QW) tri-gate MOSFETs with Al2O3/HfO2 (EOT < 1 nm) for low-power logic applications
TW Kim, DH Kim, DH Koh, HM Kwon, RH Baek, D Veksler, C Huffman, ...
2013 IEEE International Electron Devices Meeting, 16.3. 1-16.3. 4, 2013
432013
High-performance III–V devices for future logic applications
DH Kim, TW Kim, RH Baek, PD Kirsch, W Maszara, JA Del Alamo, ...
2014 IEEE International Electron Devices Meeting, 25.2. 1-25.2. 4, 2014
302014
Impact of H2 High-Pressure Annealing Onto InGaAs Quantum-Well Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack
TW Kim, HM Kwon, SH Shin, CS Shin, WK Park, E Chiu, M Rivera, JI Lew, ...
IEEE Electron Device Letters 36 (7), 672-674, 2015
232015
Buried-Pt gate InP/In0. 52Al0. 48As/In0. 7Ga0. 3As pseudomorphic HEMTs
SH Shin, TW Kim, JI Song, JH Jang
Solid-state electronics 62 (1), 106-109, 2011
152011
A New Unified Mobility Extraction Technique of In0.7Ga0.3As QW MOSFETs
JH Park, DK Kim, SW Son, SH Shin, TW Kim, JH Lee, DH Kim
IEEE Electron Device Letters 37 (9), 1096-1099, 2016
142016
Metal-semiconductor–metal varactors based on InAlN/GaN heterostructure with cutoff frequency of 308 GHz
DM Geum, SH Shin, SM Hong, JH Jang
IEEE Electron Device Letters 36 (4), 306-308, 2015
142015
Sub-100 nm regrown S/D Gate-Last In0.7Ga0.3As QW MOSFETs with μn,eff > 5,500 cm2/V-s
CS Shin, WK Park, SH Shin, YD Cho, DH Ko, TW Kim, DH Koh, HM Kwon, ...
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical …, 2014
122014
MSM Varactor Diodes Based on HEMTs With Cut-Off Frequency of 908 GHz
SH Shin, DM Geum, JH Jang
IEEE Electron Device Letters 35 (2), 172-174, 2013
122013
75 nm T‐shaped gate for In0.17Al0.83N/GaN HEMTs with minimal short‐channel effect
DM Geum, SH Shin, MS Kim, JH Jang
Electronics letters 49 (24), 1536-1537, 2013
122013
A two-step-recess process based on atomic-layer etching for high-performance In0. 52Al0. 48As/In0. 53Ga0. 47As p-HEMTs
TW Kim, DH Kim, SD Park, SH Shin, SJ Jo, HJ Song, YM Park, JO Bae, ...
IEEE transactions on electron devices 55 (7), 1577, 2008
112008
Record Effective Mobility Obtained From In0.53Ga0.47As/In0.52Al0.48As Quantum-Well MOSFETs on 300-mm Si Substrate
SW Son, JH Park, JM Baek, DK Kim, SR Lee, SM Lee, J Yoon, J Kim, ...
IEEE Electron Device Letters 38 (6), 724-727, 2017
92017
High‐frequency characteristics of Lg = 60 nm InGaAs MOS high‐electron‐mobility‐transistor (MOS‐HEMT) with Al2O3 gate insulator
TW Kim, JS Kim, DK Kim, SH Shin, WS Park, S Banerjee, DH Kim
Electronics Letters 52 (10), 870-872, 2016
82016
Damage free Ar ion plasma surface treatment on In0. 53Ga0. 47As-on-silicon metal-oxide-semiconductor device
D Koh, SH Shin, J Ahn, S Sonde, HM Kwon, T Orzali, DH Kim, TW Kim, ...
Applied Physics Letters 107 (18), 2015
62015
Detection of current induced spin polarization in epitaxial Bi2Te3 thin film
R Dey, A Roy, T Pramanik, A Rai, S Heon Shin, S Majumder, LF Register, ...
Applied Physics Letters 110 (12), 2017
52017
Performance and carrier transport analysis of In0. 7Ga0. 3As quantum-well MOSFETs with Al2O3/HfO2 gate stack
SW Son, JH Park, JM Baek, JS Kim, DK Kim, SH Shin, SK Banerjee, ...
Solid-State Electronics 123, 63-67, 2016
52016
In0. 7Ga0. 3As quantum well MOSFETs with Al2O3/HfO2 toward subthreshold swing of∼ 60 mV/dec
TW Kim, D Koh, H Kwon, CS Shin, WK Park, SH Shin, Y Cho, DH Ko, ...
Applied Physics Express 7 (7), 074201, 2014
42014
Highly Selective and Low Damage Etching of GaAs/AlGaAs Heterostructure using Cl2/O2 Neutral Beam
BJ Park, JK Yeon, WS Lim, SK Kang, JW Bae, GY Yeom, MS Jhon, ...
Plasma Chemistry and Plasma Processing 30, 633-640, 2010
42010
Characteristics of 0.2 µm depletion and quasi-enhancement mode self-aligned gate capless p-HEMTs
TW Kim, DH Kim, SH Shin, SJ Jo, JH Jang, JI Song
Electronics Letters 42 (20), 1178-1180, 2006
42006
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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